Markus Kühn

80 papers receiving 2.1k citations

Markus Kühn's Hit Papers

A quasi-static technique for MOS C-V and surface state measurements 1970 · 450 citations
4500+18+37Years since publication100200300400

Peers

Markus Kühn
Comparison fields: 5 of 87
  • Atomic and Molecular Physics, and Optics 684
  • Materials Chemistry 949
  • Electrical and Electronic Engineering 1.0k
  • Renewable Energy, Sustainability and the Environment 256
  • Structural Biology 22
Replace Arthur M. de Jong with:
Arthur M. de Jong Netherlands
T. Solomun Germany
Philippe Fontaine France
Jun Yamasaki Japan
Binbin Luo China
Xu Wu China
Dingyong Zhong China
Jan Becker Germany
Thomas B. Bright United States
Bin Gao China
Markus Kühn relative to Arthur M. de Jong Netherlands Arthur M. de Jong's profile →
Citations per field
00.5×3.1×
Arthur M. de Jong · 1×
Citations per year

Countries citing papers authored by Markus Kühn

Since Specialization
Citations

This map shows the geographic impact of Markus Kühn's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Markus Kühn with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Markus Kühn more than expected).

Fields of papers citing papers by Markus Kühn

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Markus Kühn. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Markus Kühn. The network helps show where Markus Kühn may publish in the future.

Co-authors

The 25 scholars most cited alongside Markus Kühn, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Markus Kühn Line = papers co-authored together Markus Kühn links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 81 papers — load more, or switch the sort, to bring in the rest.

#Work
1
A quasi-static technique for MOS C-V and surface state measurements
Hit paper breakdown →
1970450
2 1998339
3 199784
4 199568
5 199066
6 199764
7 201063
8 197655
9 196749
10 201148
11 196847
12 196941
13 199836
14 199936
15 196934
16 201134
17 199627
18 199725
19 200023
20 201423

About Markus Kühn

Markus Kühn is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Biomedical Engineering and Molecular Biology, having authored 81 papers that have together received 2.1k indexed citations. Recurring topics across this work include Semiconductor materials and devices (23 papers), Electron and X-Ray Spectroscopy Techniques (11 papers), Plant-derived Lignans Synthesis and Bioactivity (10 papers), Semiconductor materials and interfaces (9 papers), Electronic and Structural Properties of Oxides (9 papers), Copper Interconnects and Reliability (9 papers), Advanced Chemical Physics Studies (7 papers) and Surface and Thin Film Phenomena (7 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (684 citations), Materials Chemistry (949 citations), Electrical and Electronic Engineering (1.0k citations), Renewable Energy, Sustainability and the Environment (256 citations) and Structural Biology (22 citations). Markus Kühn has collaborated with scholars based in United States, Germany and Japan. Frequent co-authors include Ulrike Diebold, A. von Wartburg, José A. Rodríguez, Michael Schmid, G. Leonardelli, W. Hebenstreit, П. Варга, Lanping Zhang, H. Kliem and Sean W. King. Their work appears in journals such as Helvetica Chimica Acta, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Physics Letters, Surface Science and Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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