M. Simons
Impact in
-
- Semiconductor materials and devices
- Radiation Effects in Electronics
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Electrostatic Discharge in Electronics
- Advanced Memory and Neural Computing
Papers in
-
- Semiconductor materials and devices 21
- Integrated Circuits and Semiconductor Failure Analysis 14
- Advancements in Semiconductor Devices and Circuit Design 12
- Radiation Effects in Electronics 12
- Silicon and Solar Cell Technologies 4
- Chalcogenide Semiconductor Thin Films 2
- Co-authors
- H.L. Hughes (3 shared papers)E. E. King (4 shared papers)W.T. Anderson (8 shared papers)R.L. Pease (4 shared papers)R. P. Donovan (3 shared papers)John R. Hauser (2 shared papers)W. F. Tseng (2 shared papers)Paul W. Marshall (1 shared paper)
- Journals
- IEEE Transactions on Nuclear Science (14 papers)Journal of Applied Physics (4 papers)IEEE Transactions on Electron Devices (1 paper)IEEE Transactions on Reliability (1 paper)IEEE Electron Device Letters (1 paper)
- Partner nations
- United StatesFranceGermany
In The Last Decade
M. Simons
30 papers receiving 331 citations
Peers
Comparison fields: 5 of 24
- Electrical and Electronic Engineering 353
- Hardware and Architecture 20
- Radiation 23
- Surfaces, Coatings and Films 10
- Atomic and Molecular Physics, and Optics 31
Countries citing papers authored by M. Simons
This map shows the geographic impact of M. Simons's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Simons with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Simons more than expected).
Fields of papers citing papers by M. Simons
This network shows the impact of papers produced by M. Simons. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Simons. The network helps show where M. Simons may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Simons, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 32 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1972 | 38 | |
| 2 | 1981 | 27 | |
| 3 | 1979 | 26 | |
| 4 | 1982 | 25 | |
| 5 | 1971 | 24 | |
| 6 | 1985 | 21 | |
| 7 | 1968 | 19 | |
| 8 | 2001 | 19 | |
| 9 | 1994 | 19 | |
| 10 | 1983 | 16 | |
| 11 | 2003 | 15 | |
| 12 | 1987 | 14 | |
| 13 | 2009 | 13 | |
| 14 | 1974 | 13 | |
| 15 | 1972 | 12 | |
| 16 | 1986 | 12 | |
| 17 | 1997 | 9 | |
| 18 | 1991 | 8 | |
| 19 | 1969 | 8 | |
| 20 | 1982 | 4 |
About M. Simons
M. Simons is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Hardware and Architecture, Radiation and Computational Mechanics, having authored 32 papers that have together received 364 indexed citations. Recurring topics across this work include Semiconductor materials and devices (21 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers), Radiation Effects in Electronics (12 papers), VLSI and Analog Circuit Testing (4 papers), Silicon and Solar Cell Technologies (4 papers), Chalcogenide Semiconductor Thin Films (2 papers) and Radiation Detection and Scintillator Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (353 citations), Hardware and Architecture (20 citations), Radiation (23 citations), Surfaces, Coatings and Films (10 citations) and Atomic and Molecular Physics, and Optics (31 citations). M. Simons has collaborated with scholars based in United States, France and Germany. Frequent co-authors include H.L. Hughes, E. E. King, W.T. Anderson, R.L. Pease, R. P. Donovan, John R. Hauser, W. F. Tseng, Paul W. Marshall, H.B. Dietrich and Daniel M. Fleetwood. Their work appears in journals such as IEEE Transactions on Nuclear Science, Journal of Applied Physics, IEEE Transactions on Electron Devices, IEEE Transactions on Reliability and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.