J.T.M. Stevenson

790 citations

93 papers · 603 · h-index 13

Impact in

Electrical and Electronic Engineering top 10%
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Photolithography Techniques
- Electrowetting and Microfluidic Technologies
- Semiconductor materials and devices
- Advanced MEMS and NEMS Technologies
Surfaces, Coatings and Films top 10%

Papers in

Electrical and Electronic Engineering 81
- Advancements in Photolithography Techniques 30
- Integrated Circuits and Semiconductor Failure Analysis 28
- Semiconductor materials and devices 17
- Advanced MEMS and NEMS Technologies 15
- Electronic Packaging and Soldering Technologies 11
Biomedical Engineering 31
- Advanced Surface Polishing Techniques 21

Co-authors: A.J. Walton (82 shared papers)Stewart Smith (47 shared papers)A.M. Gundlach (35 shared papers)Martin McCallum (17 shared papers)Jonathan G. Terry (21 shared papers)Andrew C. Hourd (15 shared papers)L. Haworth (8 shared papers)Yifan Li (6 shared papers)
Journals: IEEE Transactions on Semiconductor Manufacturing (17 papers)IEEE Transactions on Device and Materials Reliability (3 papers)IET Nanobiotechnology (2 papers)Microelectronic Engineering (2 papers)Electronics Letters (2 papers)
Partner nations: United Kingdom United States Belgium

In The Last Decade

J.T.M. Stevenson

82 papers receiving 581 citations

Peers

Countries citing papers authored by J.T.M. Stevenson

Since Specialization

Citations

This map shows the geographic impact of J.T.M. Stevenson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.T.M. Stevenson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.T.M. Stevenson more than expected).

Fields of papers citing papers by J.T.M. Stevenson

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.T.M. Stevenson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.T.M. Stevenson. The network helps show where J.T.M. Stevenson may publish in the future.

Co-authors

The 25 scholars most cited alongside J.T.M. Stevenson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J.T.M. Stevenson Line = papers co-authored together J.T.M. Stevenson links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 93 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Room-Temperature Fabrication of Anodic Tantalum Pentoxide for Low-Voltage Electrowetting on Dielectric (EWOD) Journal of Microelectromechanical Systems ·Yifan Li, William Parkes, L. Haworth, A.W.S. Ross, J.T.M. Stevenson, A.J. Walton	2008	55
2	Development of a miniaturised drug delivery system with wireless power transfer and communication IET Nanobiotechnology ·Stewart Smith, Tong Boon Tang, Jonathan G. Terry, J.T.M. Stevenson, Brian Flynn, H. Martin Reekie, Alan F. Murray, A.M. Gundlach, D. Renshaw, B. Dhillon, Akira Ohtori, Yusuke Inoue, A.J. Walton	2007	54
3	Sheet Resistance Measurement of Non-Standard Cleanroom Materials Using Suspended Greek Cross Test Structures IEEE Transactions on Semiconductor Manufacturing ·S. Enderling, Stewart Smith, M.H. Dicks, J.T.M. Stevenson, M. Mitkova, Michael N. Kozicki, A.J. Walton	2006	40
4	Implementation of wireless power transfer and communications for an implantable ocular drug delivery system IET Nanobiotechnology ·Tong Boon Tang, Stewart Smith, Brian Flynn, J.T.M. Stevenson, A.M. Gundlach, H. Martin Reekie, Alan F. Murray, D. Renshaw, B. Dhillon, Akira Ohtori, Yusuke Inoue, Jonathan G. Terry, A.J. Walton	2008	27
5	Direct measurement of residual stress in sub-micron interconnects Semiconductor Science and Technology ·Alton B. Horsfall, Jorge M. Santos, S. Soare, Nicolas G. Wright, Alexandra Neill, S.J. Bull, A.J. Walton, A.M. Gundlach, J.T.M. Stevenson	2003	23
6	A novel approach for reducing the area occupied by contact pads on process control chips A.J. Walton, W. Gammie, D. John Morrow, J.T.M. Stevenson, R.J. Holwill	1990	18
7	Dependence of Process Parameters on Stress Generation in Aluminum Thin Films IEEE Transactions on Device and Materials Reliability ·Alton B. Horsfall, Kedi Wang, J.M.M. dos-Santos, S. Soare, S.J. Bull, Nicolas G. Wright, A.G. O’Neill, Jonathan G. Terry, A.J. Walton, A.M. Gundlach, J.T.M. Stevenson	2004	17
8	Evaluation of sheet resistance and electrical linewidth measurement techniques for copper damascene interconnect IEEE Transactions on Semiconductor Manufacturing ·Stewart Smith, A.J. Walton, A.W.S. Ross, G. Bodammer, J.T.M. Stevenson	2002	15
9	Direct Al–Al contact using low temperature wafer bonding for integrating MEMS and CMOS devices Microelectronic Engineering ·Huamao Lin, J.T.M. Stevenson, A.M. Gundlach, Camelia Dunare, A.J. Walton	2008	14
10	On-Mask CD and Overlay Test Structures for Alternating Aperture Phase Shift Lithography IEEE Transactions on Semiconductor Manufacturing ·Stewart Smith, Martin McCallum, A.J. Walton, J.T.M. Stevenson, P.D. Harris, A.W.S. Ross, Andrew C. Hourd, Liudi Jiang	2005	13
11	Cost-effective overlay and CD metrology on phase-shifting masks Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Martin McCallum, Stewart Smith, Andrew C. Hourd, A.J. Walton, J.T.M. Stevenson	2004	12
12	Electrical CD characterisation of binary and alternating aperture phase shifting masks Stewart Smith, Martin McCallum, A.J. Walton, J.T.M. Stevenson	2003	12
13	Test Chip for the Development and Evaluation of Sensors for Measuring Stress in Metal Interconnects IEEE Transactions on Semiconductor Manufacturing ·Jonathan G. Terry, Stewart Smith, A.J. Walton, A.M. Gundlach, J.T.M. Stevenson, Alton B. Horsfall, K. Wang, J.M.M. dosSantos, S. Soare, Nicolas G. Wright, A.G. O’Neill, S.J. Bull	2005	12
14	Fabrication and Measurement of Test Structures to Monitor Stress in SU-8 Films IEEE Transactions on Semiconductor Manufacturing ·Stewart Smith, N. L. Brockie, J. Murray, Giuseppe Schiavone, Christopher J. Wilson, Alton B. Horsfall, Jonathan G. Terry, J.T.M. Stevenson, Andrew R. Mount, A.J. Walton	2012	11
15	An evaluation of test structures for measuring the contact resistance of 3-D bonded interconnects Huamao Lin, Stewart Smith, J.T.M. Stevenson, A.M. Gundlach, Camelia Dunare, A.J. Walton	2008	11
16	Techniques to improve the flatness of reflective micro-optical arrays Sensors and Actuators A Physical ·K. Seunarine, David Calton, Ian Underwood, J.T.M. Stevenson, A.M. Gundlach, M. Begbie	1999	11
17	Building EWOD microfluidic array technology on top of foundry CMOS Yifan Li, P. Li, A. Kazantzis, L. Haworth, Keith R. Muir, A.W.S. Ross, Jonathan G. Terry, J.T.M. Stevenson, A.M. Gundlach, Andrew Bunting, A.J. Walton	2006	11
18	Test structures for CD and overlay metrology on alternating aperture phase-shifting masks ePrints Soton (University of Southampton) ·Stewart Smith, Martin McCallum, A.J. Walton, J.T.M. Stevenson, P.D. Harris, A.W.S. Ross, Andrew C. Hourd, Liang-Ting Jiang	2004	10
19	Improved test structures for the electrical measurement of feature size on an alternating aperture phase-shifting mask Stewart Smith, A.J. Walton, Martin McCallum, Andrew C. Hourd, J.T.M. Stevenson, A.W.S. Ross	2005	10
20	Design and fabrication of the detector technology for SCUBA-2 IEE Proceedings - Science Measurement and Technology ·A.J. Walton, William Parkes, Jonathan G. Terry, Camelia Dunare, J.T.M. Stevenson, A.M. Gundlach, G. C. Hilton, K. D. Irwin, Joel N. Ullom, W. S. Holland, William Duncan, Michael D. Audley, P. A. R. Ade, R. Sudiwala, Eric Schulte	2004	9

About J.T.M. Stevenson

J.T.M. Stevenson is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Electronic, Optical and Magnetic Materials, Mechanics of Materials and Atomic and Molecular Physics, and Optics, having authored 93 papers that have together received 603 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (30 papers), Integrated Circuits and Semiconductor Failure Analysis (28 papers), Advanced Surface Polishing Techniques (21 papers), Semiconductor materials and devices (17 papers), Advanced MEMS and NEMS Technologies (15 papers), Copper Interconnects and Reliability (12 papers), Electronic Packaging and Soldering Technologies (11 papers) and Electron and X-Ray Spectroscopy Techniques (9 papers). The work is most often cited by research in Electrical and Electronic Engineering (502 citations), Surfaces, Coatings and Films (58 citations), Biomedical Engineering (264 citations), Electronic, Optical and Magnetic Materials (68 citations) and Hardware and Architecture (23 citations). J.T.M. Stevenson has collaborated with scholars based in United Kingdom, United States and Belgium. Frequent co-authors include A.J. Walton, Stewart Smith, A.M. Gundlach, Martin McCallum, Jonathan G. Terry, Andrew C. Hourd, L. Haworth, Yifan Li, William Parkes and Alton B. Horsfall. Their work appears in journals such as IEEE Transactions on Semiconductor Manufacturing, IEEE Transactions on Device and Materials Reliability, IET Nanobiotechnology, Microelectronic Engineering and Electronics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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J.T.M. Stevenson

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About J.T.M. Stevenson

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