Joseph Fu
Impact in
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- Scientific Measurement and Uncertainty Evaluation
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- Force Microscopy Techniques and Applications
Papers in
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- Force Microscopy Techniques and Applications 30
- Surface and Thin Film Phenomena 8
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- Advanced Measurement and Metrology Techniques 17
- Co-authors
- Theodore V. Vorburger (31 shared papers)Ronald G. Dixson (25 shared papers)Ndubuisi G. Orji (10 shared papers)Susan Krueger (1 shared paper)Curtis W. Meuse (1 shared paper)Anne L. Plant (1 shared paper)Joseph A. Dura (1 shared paper)C. F. Majkrzak (1 shared paper)
- Journals
- Measurement Science and Technology (3 papers)Nanotechnology (3 papers)Journal of Micro/Nanolithography MEMS and MOEMS (3 papers)Journal of Chromatography A (2 papers)Review of Scientific Instruments (2 papers)
- Partner nations
- United StatesChinaUnited Kingdom
In The Last Decade
Joseph Fu
64 papers receiving 696 citations
Peers
Comparison fields: 5 of 80
- Statistics, Probability and Uncertainty 67
- Atomic and Molecular Physics, and Optics 297
- Surfaces, Coatings and Films 45
- Structural Biology 8
- Computational Mechanics 112
Countries citing papers authored by Joseph Fu
This map shows the geographic impact of Joseph Fu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Joseph Fu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Joseph Fu more than expected).
Fields of papers citing papers by Joseph Fu
This network shows the impact of papers produced by Joseph Fu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Joseph Fu. The network helps show where Joseph Fu may publish in the future.
Co-authors
The 25 scholars most cited alongside Joseph Fu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 65 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1998 | 105 | |
| 2 | 2005 | 40 | |
| 3 | 2005 | 34 | |
| 4 | 2018 | 30 | |
| 5 | 2005 | 30 | |
| 6 | 2000 | 28 | |
| 7 | 1999 | 26 | |
| 8 | 2012 | 25 | |
| 9 | 2002 | 24 | |
| 10 | 2016 | 21 | |
| 11 | 2004 | 19 | |
| 12 | 2014 | 18 | |
| 13 | 2006 | 17 | |
| 14 | 1999 | 16 | |
| 15 | 2001 | 16 | |
| 16 | 2013 | 14 | |
| 17 | 1995 | 13 | |
| 18 | 2010 | 13 | |
| 19 | 2017 | 13 | |
| 20 | 2004 | 13 |
About Joseph Fu
Joseph Fu is a scholar working on Atomic and Molecular Physics, and Optics, Mechanical Engineering, Biomedical Engineering, Electrical and Electronic Engineering and Computer Vision and Pattern Recognition, having authored 65 papers that have together received 723 indexed citations. Recurring topics across this work include Force Microscopy Techniques and Applications (30 papers), Advanced Measurement and Metrology Techniques (17 papers), Optical measurement and interference techniques (9 papers), Surface and Thin Film Phenomena (8 papers), Image Processing Techniques and Applications (5 papers), Advanced Surface Polishing Techniques (5 papers), Advancements in Photolithography Techniques (5 papers) and Surface Roughness and Optical Measurements (5 papers). The work is most often cited by research in Statistics, Probability and Uncertainty (67 citations), Atomic and Molecular Physics, and Optics (297 citations), Surfaces, Coatings and Films (45 citations), Structural Biology (8 citations) and Computational Mechanics (112 citations). Joseph Fu has collaborated with scholars based in United States, China and United Kingdom. Frequent co-authors include Theodore V. Vorburger, Ronald G. Dixson, Ndubuisi G. Orji, Susan Krueger, Curtis W. Meuse, Anne L. Plant, Joseph A. Dura, C. F. Majkrzak, Richard M. Silver and Jonathan Lee. Their work appears in journals such as Measurement Science and Technology, Nanotechnology, Journal of Micro/Nanolithography MEMS and MOEMS, Journal of Chromatography A and Review of Scientific Instruments.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.