IEEE Transactions on Instrumentation and Measurement · 1×
×2.947k/16kCM
×1.110k/9kBIOEN
×1.166k/60kME
×0.593k/187kEEE
×1.440k/28kMM
Citations per year
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Countries where authors publish in Measurement Science and Technology
Since Specialization
Citations
This map shows the geographic impact of research published in Measurement Science and Technology. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers published in Measurement Science and Technology with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Measurement Science and Technology more than expected).
Fields of papers published in Measurement Science and Technology
This network shows the impact of papers published in Measurement Science and Technology. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers published in Measurement Science and Technology.
About Measurement Science and Technology
The 16.3k papers published in Measurement Science and Technology in the last decades have received a total of 293.9k indexed citations . Papers published in Measurement Science and Technology usually cover Statistics, Probability and Uncertainty (783 papers), Computational Mechanics (2.2k papers), Mechanical Engineering (3.9k papers), Mechanics of Materials (2.4k papers) and Bioengineering (533 papers) specifically the topics of Advanced Measurement and Metrology Techniques (1.4k papers), Machine Fault Diagnosis Techniques (1.3k papers), Optical measurement and interference techniques (1.3k papers), Advanced Fiber Optic Sensors (1.1k papers), Non-Destructive Testing Techniques (751 papers), Surface Roughness and Optical Measurements (730 papers), Photonic and Optical Devices (725 papers) and Gear and Bearing Dynamics Analysis (718 papers). The most active scholars publishing in Measurement Science and Technology are Fulvio Scarano, Wuqiang Yang, Ralph P. Tatam, Bing Pan, Yun-Jiang Rao, E. Richard Cohen, Jerry Westerweel, Bernhard Wieneke, Steve Beeby and N.M. White.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive
bibliographic database. While OpenAlex provides broad and valuable coverage of the global
research landscape, it—like all bibliographic datasets—has inherent limitations. These include
incomplete records, variations in author disambiguation, differences in journal indexing, and
delays in data updates. As a result, some metrics and network relationships displayed in
Rankless may not fully capture the entirety of a scholar's output or impact.