James R. Von Ehr

10 papers and 344 indexed citations i.

James R. Von Ehr has authored 10 papers that have received a total of 344 indexed citations. This includes 8 papers in Atomic and Molecular Physics, and Optics, 6 papers in Electrical and Electronic Engineering and 3 papers in Materials Chemistry. The topics of these papers are Force Microscopy Techniques and Applications (5 papers), Surface and Thin Film Phenomena (3 papers) and Advanced Electron Microscopy Techniques and Applications (3 papers). James R. Von Ehr is often cited by papers focused on Force Microscopy Techniques and Applications (5 papers), Surface and Thin Film Phenomena (3 papers) and Advanced Electron Microscopy Techniques and Applications (3 papers) and collaborates with scholars based in United States and Singapore. James R. Von Ehr's co-authors include John N. Randall, Joshua B. Ballard, James H. G. Owen, Haijun Xu and Rahul Saini and has published in prestigious journals such as Applied Physics Letters, Nanotechnology and Microelectronic Engineering.