J.F. Krieg
Impact in
-
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Silicon Carbide Semiconductor Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- CCD and CMOS Imaging Sensors
Papers in
-
- Radiation Effects in Electronics 18
- Co-authors
- Ronald L. Pease (11 shared papers)Jeffery L. Titus (9 shared papers)T.L. Turflinger (9 shared papers)M. Gehlhausen (6 shared papers)Arthur B. Campbell (4 shared papers)C. Frank Wheatley (1 shared paper)D.I. Burton (1 shared paper)M.C. Maher (4 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (13 papers)European Conference on Radiation and Its Effects on Components and Systems (1 paper)IEEE Radiation Effects Data Workshop (REDW) (1 paper)
- Partner nations
- United States
In The Last Decade
J.F. Krieg
18 papers receiving 363 citations
Peers
Comparison fields: 5 of 16
- Electrical and Electronic Engineering 402
- Nuclear Energy and Engineering 1
- Safety, Risk, Reliability and Quality 2
- Software 1
- Ceramics and Composites 1
Countries citing papers authored by J.F. Krieg
This map shows the geographic impact of J.F. Krieg's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.F. Krieg with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.F. Krieg more than expected).
Fields of papers citing papers by J.F. Krieg
This network shows the impact of papers produced by J.F. Krieg. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.F. Krieg. The network helps show where J.F. Krieg may publish in the future.
Co-authors
The 25 scholars most cited alongside J.F. Krieg, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1998 | 69 | |
| 2 | 1998 | 53 | |
| 3 | 1999 | 52 | |
| 4 | 2002 | 40 | |
| 5 | 2000 | 29 | |
| 6 | 1999 | 27 | |
| 7 | 1998 | 18 | |
| 8 | 1999 | 17 | |
| 9 | 2003 | 16 | |
| 10 | 1999 | 15 | |
| 11 | 2003 | 15 | |
| 12 | 2003 | 15 | |
| 13 | 1994 | 12 | |
| 14 | 2002 | 10 | |
| 15 | 2002 | 8 | |
| 16 | 2003 | 8 | |
| 17 | 2000 | 3 | |
| 18 | 2005 | 1 |
About J.F. Krieg
J.F. Krieg is a scholar working on Electrical and Electronic Engineering, Nuclear Energy and Engineering, Waste Management and Disposal, Infectious Diseases and Organic Chemistry, having authored 18 papers that have together received 408 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (18 papers). The work is most often cited by research in Electrical and Electronic Engineering (402 citations), Nuclear Energy and Engineering (1 citation), Safety, Risk, Reliability and Quality (2 citations), Software (1 citation) and Ceramics and Composites (1 citation). J.F. Krieg has collaborated with scholars based in United States. Frequent co-authors include Ronald L. Pease, Jeffery L. Titus, T.L. Turflinger, M. Gehlhausen, Arthur B. Campbell, C. Frank Wheatley, D.I. Burton, M.C. Maher, Marty R. Shaneyfelt and Ronald D. Schrimpf. Their work appears in journals such as IEEE Transactions on Nuclear Science, European Conference on Radiation and Its Effects on Components and Systems and IEEE Radiation Effects Data Workshop (REDW).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.