J. Portillo
Impact in
- Structural Biology top 5%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Semiconductor materials and devices 4
- Advanced battery technologies research 3
-
- Electron and X-Ray Spectroscopy Techniques 6
- Co-authors
- Sònia Estradé (4 shared papers)F. Peiró (4 shared papers)Stavros Nicolopoulos (3 shared papers)H. Bender (2 shared papers)Wilfried Vandervorst (2 shared papers)Núria Llorca-Isern (1 shared paper)Mauro Gemmi (1 shared paper)M. Véron (1 shared paper)
In The Last Decade
J. Portillo
18 papers receiving 485 citations
Peers
Comparison fields: 5 of 60
- Structural Biology 72
- Surfaces, Coatings and Films 75
- Metals and Alloys 17
- Materials Chemistry 282
- Radiation 31
Countries citing papers authored by J. Portillo
This map shows the geographic impact of J. Portillo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Portillo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Portillo more than expected).
Fields of papers citing papers by J. Portillo
This network shows the impact of papers produced by J. Portillo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Portillo. The network helps show where J. Portillo may publish in the future.
Co-authors
The 25 scholars most cited alongside J. Portillo, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 133 | |
| 2 | 2006 | 76 | |
| 3 | 1989 | 62 | |
| 4 | 2020 | 60 | |
| 5 | 2011 | 33 | |
| 6 | 1989 | 23 | |
| 7 | 1999 | 17 | |
| 8 | 2007 | 16 | |
| 9 | 1999 | 15 | |
| 10 | 1999 | 14 | |
| 11 | 2018 | 12 | |
| 12 | 1999 | 11 | |
| 13 | 2000 | 10 | |
| 14 | 1998 | 8 | |
| 15 | 1996 | 2 | |
| 16 | 2000 | 2 | |
| 17 | 1991 | 1 | |
| 18 | 1997 | 1 | |
| 19 | 1993 | 0 |
About J. Portillo
J. Portillo is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Materials Chemistry, Structural Biology and Radiation, having authored 19 papers that have together received 496 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (6 papers), Semiconductor materials and devices (4 papers), Advanced Electron Microscopy Techniques and Applications (3 papers), Advanced battery technologies research (3 papers), Conducting polymers and applications (2 papers), X-ray Diffraction in Crystallography (2 papers), Ion-surface interactions and analysis (2 papers) and Microstructure and mechanical properties (2 papers). The work is most often cited by research in Structural Biology (72 citations), Surfaces, Coatings and Films (75 citations), Metals and Alloys (17 citations), Materials Chemistry (282 citations) and Radiation (31 citations). J. Portillo has collaborated with scholars based in Spain, Belgium and Brazil. Frequent co-authors include Sònia Estradé, F. Peiró, Stavros Nicolopoulos, H. Bender, Wilfried Vandervorst, Núria Llorca-Isern, Mauro Gemmi, M. Véron, А. Б. Величенко and M. Sarret. Their work appears in journals such as Ultramicroscopy, Journal of Dispersion Science and Technology, Applied Surface Science, Electrochimica Acta and Archaeometry.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.