J. Khare
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
-
- Manufacturing Process and Optimization
- Industrial Vision Systems and Defect Detection
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 21
- VLSI and FPGA Design Techniques 10
- Advancements in Photolithography Techniques 4
- Low-power high-performance VLSI design 3
-
- VLSI and Analog Circuit Testing 27
- Physical Unclonable Functions (PUFs) and Hardware Security 3
- Co-authors
- W. Maly (24 shared papers)D. Schmitt‐Landsiedel (4 shared papers)D.B.I. Feltham (2 shared papers)P. K. Nag (7 shared papers)Michael E. Thomas (2 shared papers)M. d'Abreu (4 shared papers)Janusz Rajski (2 shared papers)C. Ou-Yang (5 shared papers)
- Journals
- IEEE Transactions on Semiconductor Manufacturing (3 papers)Quality and Reliability Engineering International (1 paper)IEEE Journal of Solid-State Circuits (1 paper)Medical Entomology and Zoology (1 paper)International Conference on Computer Aided Design (1 paper)
- Partner nations
- United StatesGermanyNetherlands
In The Last Decade
J. Khare
31 papers receiving 401 citations
Peers
Comparison fields: 5 of 27
- Hardware and Architecture 337
- Industrial and Manufacturing Engineering 79
- Electrical and Electronic Engineering 383
- Architecture 2
- Control and Systems Engineering 22
Countries citing papers authored by J. Khare
This map shows the geographic impact of J. Khare's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Khare with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Khare more than expected).
Fields of papers citing papers by J. Khare
This network shows the impact of papers produced by J. Khare. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Khare. The network helps show where J. Khare may publish in the future.
Co-authors
The 13 scholars most cited alongside J. Khare, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 35 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1995 | 50 | |
| 2 | 1993 | 43 | |
| 3 | 1994 | 34 | |
| 4 | 1996 | 33 | |
| 5 | 2002 | 26 | |
| 6 | 1996 | 23 | |
| 7 | 2002 | 18 | |
| 8 | 2002 | 18 | |
| 9 | 2002 | 18 | |
| 10 | 1997 | 17 | |
| 11 | 2002 | 16 | |
| 12 | 2002 | 15 | |
| 13 | 2002 | 14 | |
| 14 | 2006 | 13 | |
| 15 | 2002 | 11 | |
| 16 | 1996 | 10 | |
| 17 | 1998 | 9 | |
| 18 | 2002 | 8 | |
| 19 | 2002 | 8 | |
| 20 | 1996 | 8 |
About J. Khare
J. Khare is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Industrial and Manufacturing Engineering, Control and Systems Engineering and Computational Mechanics, having authored 35 papers that have together received 437 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (27 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers), VLSI and FPGA Design Techniques (10 papers), Manufacturing Process and Optimization (8 papers), Industrial Vision Systems and Defect Detection (6 papers), Advancements in Photolithography Techniques (4 papers), Low-power high-performance VLSI design (3 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (3 papers). The work is most often cited by research in Hardware and Architecture (337 citations), Industrial and Manufacturing Engineering (79 citations), Electrical and Electronic Engineering (383 citations), Architecture (2 citations) and Control and Systems Engineering (22 citations). J. Khare has collaborated with scholars based in United States, Germany and Netherlands. Frequent co-authors include W. Maly, D. Schmitt‐Landsiedel, D.B.I. Feltham, P. K. Nag, Michael E. Thomas, M. d'Abreu, Janusz Rajski, C. Ou-Yang, Witold A. Pleskacz and A. Raman. Their work appears in journals such as IEEE Transactions on Semiconductor Manufacturing, Quality and Reliability Engineering International, IEEE Journal of Solid-State Circuits, Medical Entomology and Zoology and International Conference on Computer Aided Design.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.