C. Ou-Yang
Impact in
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- Manufacturing Process and Optimization
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- Product Development and Customization
Papers in
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- Manufacturing Process and Optimization 10
- Industrial Vision Systems and Defect Detection 2
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- Chaos-based Image/Signal Encryption 3
- Advanced Steganography and Watermarking Techniques 2
- Co-authors
- Ting-Lan Lin (1 shared paper)Li-Hua Gong (1 shared paper)Ting Hu (1 shared paper)Ye Liu (1 shared paper)W. Maly (5 shared papers)J. Khare (5 shared papers)Saswati Ghosh (1 shared paper)Ping Zhu (1 shared paper)
- Journals
- The International Journal of Advanced Manufacturing Technology (4 papers)International Journal of Production Research (2 papers)Nonlinear Dynamics (1 paper)IEEE Transactions on Semiconductor Manufacturing (1 paper)Pattern Recognition Letters (1 paper)
- Partner nations
- ChinaUnited StatesTaiwan
In The Last Decade
C. Ou-Yang
26 papers receiving 501 citations
Peers
Comparison fields: 5 of 62
- Industrial and Manufacturing Engineering 190
- Management of Technology and Innovation 67
- Management Information Systems 78
- Computer Vision and Pattern Recognition 155
- Management Science and Operations Research 88
Countries citing papers authored by C. Ou-Yang
This map shows the geographic impact of C. Ou-Yang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Ou-Yang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Ou-Yang more than expected).
Fields of papers citing papers by C. Ou-Yang
This network shows the impact of papers produced by C. Ou-Yang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Ou-Yang. The network helps show where C. Ou-Yang may publish in the future.
Co-authors
The 24 scholars most cited alongside C. Ou-Yang, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 27 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2016 | 136 | |
| 2 | 1997 | 122 | |
| 3 | 2008 | 83 | |
| 4 | 1998 | 43 | |
| 5 | 2002 | 25 | |
| 6 | 2010 | 18 | |
| 7 | 1997 | 17 | |
| 8 | 2008 | 13 | |
| 9 | 2002 | 13 | |
| 10 | 2018 | 11 | |
| 11 | 2002 | 11 | |
| 12 | 1999 | 10 | |
| 13 | 1998 | 9 | |
| 14 | 1993 | 6 | |
| 15 | 1999 | 6 | |
| 16 | 2001 | 5 | |
| 17 | 2002 | 3 | |
| 18 | 2010 | 3 | |
| 19 | 2012 | 3 | |
| 20 | 2002 | 2 |
About C. Ou-Yang
C. Ou-Yang is a scholar working on Industrial and Manufacturing Engineering, Computer Vision and Pattern Recognition, Management Information Systems, Electrical and Electronic Engineering and Hardware and Architecture, having authored 27 papers that have together received 547 indexed citations. Recurring topics across this work include Manufacturing Process and Optimization (10 papers), Chaos-based Image/Signal Encryption (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), VLSI and Analog Circuit Testing (3 papers), Design Education and Practice (2 papers), Business Process Modeling and Analysis (2 papers), Industrial Vision Systems and Defect Detection (2 papers) and Advanced Steganography and Watermarking Techniques (2 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (190 citations), Management of Technology and Innovation (67 citations), Management Information Systems (78 citations), Computer Vision and Pattern Recognition (155 citations) and Management Science and Operations Research (88 citations). C. Ou-Yang has collaborated with scholars based in China, United States and Taiwan. Frequent co-authors include Ting-Lan Lin, Li-Hua Gong, Ting Hu, Ye Liu, W. Maly, J. Khare, Saswati Ghosh, Ping Zhu, Andrzej J. Strojwas and Ram Akella. Their work appears in journals such as The International Journal of Advanced Manufacturing Technology, International Journal of Production Research, Nonlinear Dynamics, IEEE Transactions on Semiconductor Manufacturing and Pattern Recognition Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.