D. Appello
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
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- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Semiconductor materials and devices
- VLSI and FPGA Design Techniques
Papers in
-
- VLSI and Analog Circuit Testing 48
- Physical Unclonable Functions (PUFs) and Hardware Security 5
- Embedded Systems Design Techniques 4
-
- Integrated Circuits and Semiconductor Failure Analysis 40
- Radiation Effects in Electronics 14
- Semiconductor materials and devices 9
- Electrostatic Discharge in Electronics 7
- VLSI and FPGA Design Techniques 4
- Co-authors
- Paolo Bernardi (37 shared papers)M. Sonza Reorda (32 shared papers)Michelangelo Grosso (12 shared papers)Maurizio Rebaudengo (8 shared papers)Aubin Roy (1 shared paper)Stephen Sunter (1 shared paper)Emil Gizdarski (2 shared papers)M. Violante (2 shared papers)
- Journals
- IEEE Access (2 papers)IEEE Transactions on Very Large Scale Integration (VLSI) Systems (1 paper)IEEE Design and Test (1 paper)IEEE Transactions on Nuclear Science (1 paper)IEEE Transactions on Computers (1 paper)
- Partner nations
- ItalyUnited StatesSwitzerland
In The Last Decade
D. Appello
55 papers receiving 393 citations
Peers
Comparison fields: 5 of 35
- Hardware and Architecture 354
- Electrical and Electronic Engineering 350
- Software 23
- Industrial and Manufacturing Engineering 35
- Control and Systems Engineering 53
Countries citing papers authored by D. Appello
This map shows the geographic impact of D. Appello's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Appello with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Appello more than expected).
Fields of papers citing papers by D. Appello
This network shows the impact of papers produced by D. Appello. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Appello. The network helps show where D. Appello may publish in the future.
Co-authors
The 25 scholars most cited alongside D. Appello, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 57 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 34 | |
| 2 | 2003 | 34 | |
| 3 | 2021 | 23 | |
| 4 | 2006 | 22 | |
| 5 | 2004 | 22 | |
| 6 | 2010 | 17 | |
| 7 | 2006 | 17 | |
| 8 | 2017 | 16 | |
| 9 | 2006 | 16 | |
| 10 | 2001 | 14 | |
| 11 | 2004 | 14 | |
| 12 | 2019 | 11 | |
| 13 | 2004 | 10 | |
| 14 | 2018 | 10 | |
| 15 | 2009 | 10 | |
| 16 | 2011 | 9 | |
| 17 | 2021 | 9 | |
| 18 | 2022 | 8 | |
| 19 | 2011 | 8 | |
| 20 | 2020 | 8 |
About D. Appello
D. Appello is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Control and Systems Engineering, Computer Networks and Communications and Industrial and Manufacturing Engineering, having authored 57 papers that have together received 423 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (48 papers), Integrated Circuits and Semiconductor Failure Analysis (40 papers), Radiation Effects in Electronics (14 papers), Semiconductor materials and devices (9 papers), Electrostatic Discharge in Electronics (7 papers), Physical Unclonable Functions (PUFs) and Hardware Security (5 papers), Embedded Systems Design Techniques (4 papers) and VLSI and FPGA Design Techniques (4 papers). The work is most often cited by research in Hardware and Architecture (354 citations), Electrical and Electronic Engineering (350 citations), Software (23 citations), Industrial and Manufacturing Engineering (35 citations) and Control and Systems Engineering (53 citations). D. Appello has collaborated with scholars based in Italy, United States and Switzerland. Frequent co-authors include Paolo Bernardi, M. Sonza Reorda, Michelangelo Grosso, Maurizio Rebaudengo, Aubin Roy, Stephen Sunter, Emil Gizdarski, M. Violante, Ernesto Sánchez and Fulvio Corno. Their work appears in journals such as IEEE Access, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Design and Test, IEEE Transactions on Nuclear Science and IEEE Transactions on Computers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.