G.L. Schnable

721 citations
57 papers · 578 · h-index 13

Impact in

Papers in

    • Semiconductor materials and devices 28
    • Integrated Circuits and Semiconductor Failure Analysis 21
    • Silicon and Solar Cell Technologies 13
    • Advancements in Semiconductor Devices and Circuit Design 10
    • Radiation Effects in Electronics 6
    • Thin-Film Transistor Technologies 6
    • Semiconductor materials and interfaces 11

G.L. Schnable

52 papers receiving 483 citations

Peers

G.L. Schnable
Comparison fields: 5 of 65
  • Electrical and Electronic Engineering 453
  • Electronic, Optical and Magnetic Materials 108
  • Ceramics and Composites 32
  • Atomic and Molecular Physics, and Optics 113
  • Bioengineering 17
Replace Y. Danto with:
Y. Danto France
Sunil Wickramanayaka Japan
Hiroshi Osanai Japan
David Trémouilles France
Wei-Cheng Lien Taiwan
Osamu Nakada Japan
S.A. Awan United Kingdom
K. Tsuji Japan
Tae‐Ho Lee South Korea
W. D. Drotning United States
G.L. Schnable relative to Y. Danto France Y. Danto's profile →
Citations per field
00.5×1.5×2×2.4×
Y. Danto · 1×
Citations per year

Countries citing papers authored by G.L. Schnable

Since Specialization
Citations

This map shows the geographic impact of G.L. Schnable's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G.L. Schnable with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G.L. Schnable more than expected).

Fields of papers citing papers by G.L. Schnable

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G.L. Schnable. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G.L. Schnable. The network helps show where G.L. Schnable may publish in the future.

Co-authors

The 19 scholars most cited alongside G.L. Schnable, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with G.L. Schnable Line = papers co-authored together G.L. Schnable links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 57 papers — load more, or switch the sort, to bring in the rest.

#Work
1 197963
2 197442
3 197533
4 199032
5 196931
6 196927
7 196827
8 197725
9 197025
10 198014
11 198113
12
CVD glass films for passivation of silicon devices - Preparation, composition, and stress properties
197613
13 196713
14 197212
15 195312
16 195611
17 195411
18 197211
19 197811
20 196711

About G.L. Schnable

G.L. Schnable is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Electronic, Optical and Magnetic Materials and Surfaces, Coatings and Films, having authored 57 papers that have together received 578 indexed citations. Recurring topics across this work include Semiconductor materials and devices (28 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers), Silicon and Solar Cell Technologies (13 papers), Semiconductor materials and interfaces (11 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), Radiation Effects in Electronics (6 papers), Thin-Film Transistor Technologies (6 papers) and Copper Interconnects and Reliability (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (453 citations), Electronic, Optical and Magnetic Materials (108 citations), Ceramics and Composites (32 citations), Atomic and Molecular Physics, and Optics (113 citations) and Bioengineering (17 citations). G.L. Schnable has collaborated with scholars based in United States, Finland and Japan. Frequent co-authors include Werner Kern, R. B. Comizzoli, J. L. Vossen, John M. Shaw, J. Fred Hazel, J.P. Spratt, J. A. Amick, John L. Vossen, L. K. White and Wallace M. McNabb. Their work appears in journals such as Journal of The Electrochemical Society, IEEE Transactions on Electron Devices, Microelectronics Reliability, IEEE Transactions on Reliability and Analytica Chimica Acta.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact