Y. Danto

720 citations
72 papers · 474 · h-index 12

Impact in

    • Semiconductor materials and devices
    • Integrated Circuits and Semiconductor Failure Analysis
    • Electronic Packaging and Soldering Technologies
    • Advancements in Semiconductor Devices and Circuit Design
    • Advanced Battery Materials and Technologies
    • 3D IC and TSV technologies

Papers in

Y. Danto

68 papers receiving 446 citations

Peers

Y. Danto
Comparison fields: 5 of 60
  • Electrical and Electronic Engineering 352
  • Ceramics and Composites 34
  • Inorganic Chemistry 69
  • Bioengineering 21
  • Electronic, Optical and Magnetic Materials 41
Replace Sourav Das with:
Sourav Das India
Myung Seung Yang South Korea
F. Sabary France
Kazumasa Nakamura Japan
Janusz Jaglarz Poland
Tatsuo Fukami Japan
Roland Müller‐Fiedler Germany
Sunil Wickramanayaka Japan
T. Suganuma Japan
F. Sthal France
Y. Danto relative to Sourav Das India Sourav Das's profile →
Citations per field
00.5×
Sourav Das · 1×
Citations per year

Countries citing papers authored by Y. Danto

Since Specialization
Citations

This map shows the geographic impact of Y. Danto's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Danto with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Danto more than expected).

Fields of papers citing papers by Y. Danto

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y. Danto. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Danto. The network helps show where Y. Danto may publish in the future.

Co-authors

The 25 scholars most cited alongside Y. Danto, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Y. Danto Line = papers co-authored together Y. Danto links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 72 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200044
2 198340
3 199332
4 197831
5 199221
6 200319
7 198116
8 200615
9 200313
10 197512
11 199912
12 200011
13 200310
14 197910
15 20069
16 19729
17 19799
18 19968
19 19758
20 20048

About Y. Danto

Y. Danto is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Mechanical Engineering, Biomedical Engineering and Inorganic Chemistry, having authored 72 papers that have together received 474 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (25 papers), Semiconductor materials and devices (20 papers), Electronic Packaging and Soldering Technologies (15 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers), Inorganic Fluorides and Related Compounds (11 papers), 3D IC and TSV technologies (7 papers), Semiconductor Quantum Structures and Devices (5 papers) and Laser Material Processing Techniques (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (352 citations), Ceramics and Composites (34 citations), Inorganic Chemistry (69 citations), Bioengineering (21 citations) and Electronic, Optical and Magnetic Materials (41 citations). Y. Danto has collaborated with scholars based in France, Netherlands and Spain. Frequent co-authors include J. Salardenne, G. Couturier, A.S. Barrière, Jean-Yves Delétage, Nathalie Labat, A. Touboul, Jacques Pistré, H. Frémont, Paul Hagenmuller and A. Levasseur. Their work appears in journals such as Microelectronics Reliability, Thin Solid Films, Quality and Reliability Engineering International, Solid State Ionics and Microelectronic Engineering.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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