Y. Danto
Impact in
-
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Electronic Packaging and Soldering Technologies
- Advancements in Semiconductor Devices and Circuit Design
- 3D IC and TSV technologies
- Advanced Battery Materials and Technologies
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 26
- Semiconductor materials and devices 21
- Electronic Packaging and Soldering Technologies 15
- Advancements in Semiconductor Devices and Circuit Design 12
- 3D IC and TSV technologies 7
- Electrostatic Discharge in Electronics 6
-
- Semiconductor Quantum Structures and Devices 6
- Co-authors
- J. Salardenne (13 shared papers)G. Couturier (6 shared papers)Jean-Yves Delétage (5 shared papers)A.S. Barrière (8 shared papers)Nathalie Labat (12 shared papers)Jacques Pistré (5 shared papers)A. Touboul (12 shared papers)H. Frémont (6 shared papers)
- Journals
- Microelectronics Reliability (20 papers)Thin Solid Films (9 papers)Quality and Reliability Engineering International (5 papers)Solid State Ionics (4 papers)Microelectronic Engineering (4 papers)
- Partner nations
- FranceUnited StatesGermany
In The Last Decade
Y. Danto
70 papers receiving 480 citations
Peers
Comparison fields: 5 of 62
- Electrical and Electronic Engineering 380
- Ceramics and Composites 35
- Inorganic Chemistry 71
- Bioengineering 22
- Electronic, Optical and Magnetic Materials 45
Countries citing papers authored by Y. Danto
This map shows the geographic impact of Y. Danto's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Danto with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Danto more than expected).
Fields of papers citing papers by Y. Danto
This network shows the impact of papers produced by Y. Danto. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Danto. The network helps show where Y. Danto may publish in the future.
Co-authors
The 25 scholars most cited alongside Y. Danto, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 74 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1983 | 47 | |
| 2 | 2000 | 47 | |
| 3 | 1993 | 36 | |
| 4 | 1978 | 32 | |
| 5 | 1992 | 23 | |
| 6 | 2003 | 21 | |
| 7 | 1981 | 17 | |
| 8 | 2006 | 15 | |
| 9 | 2003 | 15 | |
| 10 | 1999 | 13 | |
| 11 | 1979 | 12 | |
| 12 | 1975 | 12 | |
| 13 | 2003 | 12 | |
| 14 | 2000 | 11 | |
| 15 | 2006 | 10 | |
| 16 | 1972 | 9 | |
| 17 | 1979 | 9 | |
| 18 | 2003 | 9 | |
| 19 | 2004 | 9 | |
| 20 | 1996 | 8 |
About Y. Danto
Y. Danto is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Mechanical Engineering, Biomedical Engineering and Inorganic Chemistry, having authored 74 papers that have together received 514 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (26 papers), Semiconductor materials and devices (21 papers), Electronic Packaging and Soldering Technologies (15 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers), Inorganic Fluorides and Related Compounds (11 papers), 3D IC and TSV technologies (7 papers), Semiconductor Quantum Structures and Devices (6 papers) and Electrostatic Discharge in Electronics (6 papers). The work is most often cited by research in Electrical and Electronic Engineering (380 citations), Ceramics and Composites (35 citations), Inorganic Chemistry (71 citations), Bioengineering (22 citations) and Electronic, Optical and Magnetic Materials (45 citations). Y. Danto has collaborated with scholars based in France, United States and Germany. Frequent co-authors include J. Salardenne, G. Couturier, Jean-Yves Delétage, A.S. Barrière, Nathalie Labat, Jacques Pistré, A. Touboul, H. Frémont, Paul Hagenmuller and A. Levasseur. Their work appears in journals such as Microelectronics Reliability, Thin Solid Films, Quality and Reliability Engineering International, Solid State Ionics and Microelectronic Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.