F. Jamin
Impact in
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- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Low-power high-performance VLSI design
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- Quantum and electron transport phenomena
- Semiconductor materials and interfaces
Papers in
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- Semiconductor materials and devices 5
- Advancements in Semiconductor Devices and Circuit Design 3
- Integrated Circuits and Semiconductor Failure Analysis 2
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- GaN-based semiconductor devices and materials 2
- Co-authors
- Wilfried Haensch (2 shared papers)M. Ieong (2 shared papers)T. Kanarsky (1 shared paper)R. Roy (1 shared paper)E.C. Jones (1 shared paper)O. Dokumaci (1 shared paper)Zhibin Ren (1 shared paper)A. Mocuta (1 shared paper)
- Journals
- Microelectronics Reliability (1 paper)Solid-State Electronics (1 paper)MRS Proceedings (1 paper)Proceedings - International Symposium for Testing and Failure Analysis (1 paper)
- Partner nations
- United StatesFranceAustralia
In The Last Decade
F. Jamin
4 papers receiving 153 citations
Peers
Comparison fields: 5 of 11
- Electrical and Electronic Engineering 160
- Atomic and Molecular Physics, and Optics 38
- Biomedical Engineering 27
- Materials Chemistry 16
- Computational Theory and Mathematics 3
Countries citing papers authored by F. Jamin
This map shows the geographic impact of F. Jamin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Jamin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Jamin more than expected).
Fields of papers citing papers by F. Jamin
This network shows the impact of papers produced by F. Jamin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Jamin. The network helps show where F. Jamin may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Jamin, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 136 | |
| 2 | 2004 | 29 | |
| 3 | 2001 | 2 | |
| 4 | 2023 | 1 | |
| 5 | 2023 | 0 | |
| 6 | 2006 | 0 |
About F. Jamin
F. Jamin is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Ceramics and Composites and Electronic, Optical and Magnetic Materials, having authored 6 papers that have together received 168 indexed citations. Recurring topics across this work include Semiconductor materials and devices (5 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), GaN-based semiconductor devices and materials (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Quantum and electron transport phenomena (1 paper), Copper Interconnects and Reliability (1 paper), Advanced ceramic materials synthesis (1 paper) and Advanced Surface Polishing Techniques (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (160 citations), Atomic and Molecular Physics, and Optics (38 citations), Biomedical Engineering (27 citations), Materials Chemistry (16 citations) and Computational Theory and Mathematics (3 citations). F. Jamin has collaborated with scholars based in United States, France and Australia. Frequent co-authors include Wilfried Haensch, M. Ieong, T. Kanarsky, R. Roy, E.C. Jones, O. Dokumaci, Zhibin Ren, A. Mocuta, B. Doris and Leathen Shi. Their work appears in journals such as Microelectronics Reliability, Solid-State Electronics, MRS Proceedings and Proceedings - International Symposium for Testing and Failure Analysis.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.