D. Giot

603 citations
10 papers · 511 · h-index 9

Impact in

    • VLSI and Analog Circuit Testing
    • Physical Unclonable Functions (PUFs) and Hardware Security
    • Radiation Effects in Electronics
    • Semiconductor materials and devices
    • Integrated Circuits and Semiconductor Failure Analysis
    • Low-power high-performance VLSI design
    • Advancements in Semiconductor Devices and Circuit Design
    • Advanced Memory and Neural Computing

Papers in

    • Radiation Effects in Electronics 10
    • Integrated Circuits and Semiconductor Failure Analysis 7
    • Semiconductor materials and devices 4
    • Advancements in Semiconductor Devices and Circuit Design 2
    • VLSI and Analog Circuit Testing 6
    • Physical Unclonable Functions (PUFs) and Hardware Security 1

D. Giot

10 papers receiving 486 citations

Peers

D. Giot
Comparison fields: 5 of 17
  • Hardware and Architecture 277
  • Electrical and Electronic Engineering 507
  • Radiation 13
  • Safety, Risk, Reliability and Quality 14
  • Nuclear and High Energy Physics 12
Replace G. Bruguier with:
G. Bruguier France
S. Doyle United States
Maxim S. Gorbunov Russia
N. J. Gaspard United States
Jonathan R. Ahlbin United States
Taiki Uemura Japan
Francisco J. Franco Spain
Tim Irwin United States
Maximilien Glorieux France
Dolores Black United States
D. Giot relative to G. Bruguier France G. Bruguier's profile →
Citations per field
00.5×1.5×2.4×
G. Bruguier · 1×
Citations per year

Countries citing papers authored by D. Giot

Since Specialization
Citations

This map shows the geographic impact of D. Giot's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Giot with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Giot more than expected).

Fields of papers citing papers by D. Giot

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Giot. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Giot. The network helps show where D. Giot may publish in the future.

Co-authors

The 11 scholars most cited alongside D. Giot, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D. Giot Line = papers co-authored together D. Giot links everyone, so they are left out of the graph.

All Works

10 of 10 papers shown
#Work
1 2007119
2 2006113
3 200855
4 200755
5 200651
6 200750
7 200729
8 200722
9 200814
10 20073

About D. Giot

D. Giot is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Infectious Diseases, Organic Chemistry and Surgery, having authored 10 papers that have together received 511 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (10 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), VLSI and Analog Circuit Testing (6 papers), Semiconductor materials and devices (4 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (1 paper). The work is most often cited by research in Hardware and Architecture (277 citations), Electrical and Electronic Engineering (507 citations), Radiation (13 citations), Safety, Risk, Reliability and Quality (14 citations) and Nuclear and High Energy Physics (12 citations). D. Giot has collaborated with scholars based in France, Netherlands and India. Frequent co-authors include P. Roche, Gilles Gasiot, Tino Heijmen, R. Harboe-Sørensen, Philippe Roché, Jean‐Luc Autran, Frédéric Saigné, J. Boch, B. Sagnes and J.L. Autran. Their work appears in journals such as IEEE Transactions on Nuclear Science and IEEE Transactions on Device and Materials Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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