Colin Maunder
Impact in
- Hardware and Architecture top 0.5%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
- Embedded Systems Design Techniques
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- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- VLSI and FPGA Design Techniques
- Low-power high-performance VLSI design
Papers in
-
- VLSI and Analog Circuit Testing 12
- Embedded Systems Design Techniques 2
-
- Integrated Circuits and Semiconductor Failure Analysis 6
- Low-power high-performance VLSI design 1
- Co-authors
- Rodham E. Tulloss (3 shared papers)R.G. Bennetts (1 shared paper)Alfred L. Crouch (1 shared paper)D.H. Roberts (1 shared paper)
- Journals
- Electronics & Communications Engineering Journal (1 paper)Microprocessors and Microsystems (2 papers)IEEE Spectrum (2 papers)Journal of Electronic Testing (1 paper)International Test Conference (1 paper)
- Partner nations
- United KingdomUnited States
In The Last Decade
Colin Maunder
14 papers receiving 1.1k citations
Colin Maunder's Hit Papers
Peers
Comparison fields: 5 of 41
- Hardware and Architecture 1.2k
- Electrical and Electronic Engineering 1.1k
- Software 51
- Control and Systems Engineering 260
- Computer Networks and Communications 77
Countries citing papers authored by Colin Maunder
This map shows the geographic impact of Colin Maunder's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Colin Maunder with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Colin Maunder more than expected).
Fields of papers citing papers by Colin Maunder
This network shows the impact of papers produced by Colin Maunder. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Colin Maunder. The network helps show where Colin Maunder may publish in the future.
Co-authors
The 4 scholars most cited alongside Colin Maunder, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | The Test Access Port and Boundary-Scan Architecture Hit paper breakdown → | 1990 | 582 |
| 2 | Built-in test for VLSI — pseudorandom techniques Hit paper breakdown → | 1989 | 525 |
| 3 | 1986 | 63 | |
| 4 | 1981 | 30 | |
| 5 | 1992 | 19 | |
| 6 | 1991 | 11 | |
| 7 | 2002 | 8 | |
| 8 | The board designer's guide to testable logic circuits | 1992 | 6 |
| 9 | 1986 | 4 | |
| 10 | 2002 | 4 | |
| 11 | HITEST Test Generation System Interfaces. | 1983 | 3 |
| 12 | 1994 | 3 | |
| 13 | 1992 | 2 | |
| 14 | 1990 | 2 | |
| 15 | 1984 | 1 | |
| 16 | 1998 | 0 | |
| 17 | 2005 | 0 |
About Colin Maunder
Colin Maunder is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Control and Systems Engineering, Media Technology and Computer Networks and Communications, having authored 17 papers that have together received 1.3k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (12 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Engineering and Test Systems (5 papers), Embedded Systems Design Techniques (2 papers), Experimental Learning in Engineering (2 papers), Interconnection Networks and Systems (1 paper), Semantic Web and Ontologies (1 paper) and Low-power high-performance VLSI design (1 paper). The work is most often cited by research in Hardware and Architecture (1.2k citations), Electrical and Electronic Engineering (1.1k citations), Software (51 citations), Control and Systems Engineering (260 citations) and Computer Networks and Communications (77 citations). Colin Maunder has collaborated with scholars based in United Kingdom and United States. Frequent co-authors include Rodham E. Tulloss, R.G. Bennetts, Alfred L. Crouch and D.H. Roberts. Their work appears in journals such as Electronics & Communications Engineering Journal, Microprocessors and Microsystems, IEEE Spectrum, Journal of Electronic Testing and International Test Conference.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.