Journal of Electronic Testing

1.4k papers and 8.1k indexed citations i.

About

The 1.4k papers published in Journal of Electronic Testing in the last decades have received a total of 8.1k indexed citations. Papers published in Journal of Electronic Testing usually cover Electrical and Electronic Engineering (1.2k papers), Hardware and Architecture (1.1k papers) and Control and Systems Engineering (132 papers) specifically the topics of VLSI and Analog Circuit Testing (965 papers), Integrated Circuits and Semiconductor Failure Analysis (696 papers) and Radiation Effects in Electronics (385 papers). The most active scholars publishing in Journal of Electronic Testing are Erik Jan Marinissen, Krishnendu Chakrabarty, Y. Zorian, Hans-Joachim Wunderlich, Vikram Iyengar, Vishwani D. Agrawal, Ujjwal Guin, Fabrizio Lombardi, M. Nicolaidis and Mohammad Tehranipoor.

In The Last Decade

Fields of papers published in Journal of Electronic Testing

Since Specialization
EngineeringComputer SciencePhysics and AstronomyMathematicsEarth and Planetary SciencesEnergyEnvironmental ScienceMaterials ScienceChemical EngineeringChemistryAgricultural and Biological SciencesVeterinaryDecision SciencesArts and HumanitiesBusiness, Management and AccountingSocial SciencesPsychologyEconomics, Econometrics and FinanceHealth ProfessionsDentistryMedicineBiochemistry, Genetics and Molecular BiologyNeuroscienceNursingImmunology and MicrobiologyPharmacology, Toxicology and Pharmaceutics

This network shows the specialization of papers published in Journal of Electronic Testing. Nodes represent fields, and links connect fields that are likely to share authors.

Countries where authors publish in Journal of Electronic Testing

Since Specialization
Total citations of papers

This map shows the geographic distribution of research published in Journal of Electronic Testing. It shows the number of citations received by papers published by authors working in each country. You can also color the map by specialization and compare the number of papers published in Journal of Electronic Testing with the expected number of papers based on a country's size and research output (numbers larger than one mean the country's share of papers is larger than expected).

Rankless by CCL
2025