Journal of Electronic Testing

14.2k citations
1.5k papers · · active since 1950

Impact in

    • VLSI and Analog Circuit Testing
    • Physical Unclonable Functions (PUFs) and Hardware Security
    • Integrated Circuits and Semiconductor Failure Analysis
    • Radiation Effects in Electronics
    • Low-power high-performance VLSI design
    • VLSI and FPGA Design Techniques
    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design

Papers in

Journal of Electronic Testing

1.4k papers receiving 13.2k citations

Peers

Journal of Electronic Testing
Comparison fields: 5 of 133
  • Hardware and Architecture 9.9k
  • Electrical and Electronic Engineering 11.5k
  • Software 737
  • Computational Theory and Mathematics 1.0k
  • Control and Systems Engineering 1.3k
Replace ACM Transactions on Design Automation of Electronic Systems with:
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IEEE Transactions on Device and Materials Reliability United States
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Journal of Electronic Testing relative to ACM Transactions on Design Automation of Electronic Systems United States ACM Transactions on Design Automation of Electronic Systems's profile →
Citations per field
00.5×1.5×2.3×
ACM Transactions on Design Automation of Electronic Systems · 1×
Citations per year

Countries where authors publish in Journal of Electronic Testing

Since Specialization
Citations

This map shows the geographic impact of research published in Journal of Electronic Testing. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers published in Journal of Electronic Testing with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Journal of Electronic Testing more than expected).

Fields of papers published in Journal of Electronic Testing

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers published in Journal of Electronic Testing. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers published in Journal of Electronic Testing.

About Journal of Electronic Testing

The 1.5k papers published in Journal of Electronic Testing in the last decades have received a total of 14.2k indexed citations . Papers published in Journal of Electronic Testing usually cover Hardware and Architecture (1.1k papers), Software (119 papers), Electrical and Electronic Engineering (1.3k papers), Control and Systems Engineering (141 papers) and Computational Theory and Mathematics (92 papers) specifically the topics of VLSI and Analog Circuit Testing (998 papers), Integrated Circuits and Semiconductor Failure Analysis (718 papers), Radiation Effects in Electronics (401 papers), Low-power high-performance VLSI design (223 papers), VLSI and FPGA Design Techniques (132 papers), Physical Unclonable Functions (PUFs) and Hardware Security (116 papers), Semiconductor materials and devices (110 papers) and Advancements in Semiconductor Devices and Circuit Design (97 papers). The most active scholars publishing in Journal of Electronic Testing are Erik Jan Marinissen, Krishnendu Chakrabarty, Y. Zorian, Hans-Joachim Wunderlich, Vikram Iyengar, M. Nicolaidis, Vishwani D. Agrawal, Ujjwal Guin, Mohammad Tehranipoor and Daniel DiMase.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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