Journal of Electronic Testing

14.5k citations
1.5k papers · · active since 1990

Impact in

    • VLSI and Analog Circuit Testing
    • Physical Unclonable Functions (PUFs) and Hardware Security
    • Embedded Systems Design Techniques
  • Software top 5%
    • Software Testing and Debugging Techniques

Papers in

    • VLSI and Analog Circuit Testing 1k
    • Physical Unclonable Functions (PUFs) and Hardware Security 68
    • Embedded Systems Design Techniques 27
    • Software Testing and Debugging Techniques 68

Journal of Electronic Testing

1.4k papers receiving 13.6k citations

Peers

Journal of Electronic Testing
Comparison fields: 5 of 99
  • Hardware and Architecture 9.7k
  • Software 412
  • Electrical and Electronic Engineering 3.6k
  • Computational Theory and Mathematics 720
  • Artificial Intelligence 977
Replace ACM Transactions on Design Automation of Electronic Systems with:
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Journal of Electronic Testing relative to ACM Transactions on Design Automation of Electronic Systems United States ACM Transactions on Design Automation of Electronic Systems's profile →
Citations per field
00.5×1.5×
ACM Transactions on Design Automation of Electronic Systems · 1×
Citations per year

Countries where authors publish in Journal of Electronic Testing

Since Specialization
Citations

This map shows the geographic impact of research published in Journal of Electronic Testing. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers published in Journal of Electronic Testing with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Journal of Electronic Testing more than expected).

Fields of papers published in Journal of Electronic Testing

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers published in Journal of Electronic Testing. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers published in Journal of Electronic Testing.

About Journal of Electronic Testing

The 1.5k papers published in Journal of Electronic Testing in the last decades have received a total of 14.5k indexed citations . Papers published in Journal of Electronic Testing usually cover Hardware and Architecture (1.1k papers), Software (71 papers), Electrical and Electronic Engineering (377 papers), Computational Theory and Mathematics (53 papers) and Computer Networks and Communications (50 papers) specifically the topics of VLSI and Analog Circuit Testing (1k papers), Radiation Effects in Electronics (198 papers), Physical Unclonable Functions (PUFs) and Hardware Security (68 papers), Software Testing and Debugging Techniques (68 papers), Low-power high-performance VLSI design (55 papers), Formal Methods in Verification (31 papers), Interconnection Networks and Systems (27 papers) and Embedded Systems Design Techniques (27 papers). The most active scholars publishing in Journal of Electronic Testing are Erik Jan Marinissen, Krishnendu Chakrabarty, Y. Zorian, Hans-Joachim Wunderlich, M. Nicolaidis, V. Iyengar, Ujjwal Guin, Mohammad Tehranipoor, Daniel DiMase and Vishwani D. Agrawal.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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