R.G. Bennetts
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Embedded Systems Design Techniques
- Software top 5%
- Software Reliability and Analysis Research
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 11
- VLSI and FPGA Design Techniques 6
- Radiation Effects in Electronics 3
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- VLSI and Analog Circuit Testing 16
- Embedded Systems Design Techniques 3
- Co-authors
- F. P. M. Beenker (3 shared papers)A. P. Thijssen (2 shared papers)Gary J. Powers (1 shared paper)J.B. Fussell (1 shared paper)Colin Maunder (1 shared paper)Erik Jan Marinissen (1 shared paper)Bart Vermeulen (1 shared paper)Henk D. L. Hollmann (1 shared paper)
- Journals
- IEEE Transactions on Reliability (3 papers)Computer (2 papers)The Computer Journal (2 papers)IEEE Transactions on Computers (1 paper)Journal of Electronic Testing (1 paper)
- Partner nations
- United KingdomNetherlandsUnited States
In The Last Decade
R.G. Bennetts
25 papers receiving 442 citations
Peers
Comparison fields: 5 of 53
- Hardware and Architecture 261
- Software 99
- Statistics, Probability and Uncertainty 51
- Safety, Risk, Reliability and Quality 60
- Electrical and Electronic Engineering 250
Countries citing papers authored by R.G. Bennetts
This map shows the geographic impact of R.G. Bennetts's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.G. Bennetts with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.G. Bennetts more than expected).
Fields of papers citing papers by R.G. Bennetts
This network shows the impact of papers produced by R.G. Bennetts. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.G. Bennetts. The network helps show where R.G. Bennetts may publish in the future.
Co-authors
The 9 scholars most cited alongside R.G. Bennetts, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 26 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Design of testable logic circuits | 1984 | 73 |
| 2 | 1975 | 70 | |
| 3 | 1981 | 54 | |
| 4 | 1982 | 49 | |
| 5 | 1974 | 38 | |
| 6 | 1981 | 30 | |
| 7 | 1995 | 28 | |
| 8 | Introduction to Digital Board Testing | 1982 | 21 |
| 9 | 1995 | 20 | |
| 10 | 2003 | 19 | |
| 11 | 1976 | 15 | |
| 12 | 1972 | 14 | |
| 13 | 1991 | 9 | |
| 14 | 1971 | 9 | |
| 15 | 1981 | 8 | |
| 16 | 1971 | 8 | |
| 17 | 1972 | 4 | |
| 18 | 1978 | 4 | |
| 19 | 1971 | 3 | |
| 20 | 1975 | 3 |
About R.G. Bennetts
R.G. Bennetts is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Control and Systems Engineering, Software and Computer Networks and Communications, having authored 26 papers that have together received 487 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (16 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Engineering and Test Systems (8 papers), VLSI and FPGA Design Techniques (6 papers), Software Reliability and Analysis Research (5 papers), Radiation Effects in Electronics (3 papers), Embedded Systems Design Techniques (3 papers) and Distributed systems and fault tolerance (2 papers). The work is most often cited by research in Hardware and Architecture (261 citations), Software (99 citations), Statistics, Probability and Uncertainty (51 citations), Safety, Risk, Reliability and Quality (60 citations) and Electrical and Electronic Engineering (250 citations). R.G. Bennetts has collaborated with scholars based in United Kingdom, Netherlands and United States. Frequent co-authors include F. P. M. Beenker, A. P. Thijssen, Gary J. Powers, J.B. Fussell, Colin Maunder, Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann and S.L. Hurst. Their work appears in journals such as IEEE Transactions on Reliability, Computer, The Computer Journal, IEEE Transactions on Computers and Journal of Electronic Testing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.