C. Barillot

442 citations
20 papers · 348 · h-index 8

Impact in

    • VLSI and Analog Circuit Testing
    • Radiation Effects in Electronics
    • Integrated Circuits and Semiconductor Failure Analysis
    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Low-power high-performance VLSI design

Papers in

    • Radiation Effects in Electronics 16
    • Semiconductor materials and devices 8
    • Integrated Circuits and Semiconductor Failure Analysis 5
    • Advancements in Semiconductor Devices and Circuit Design 3
    • Electrostatic Discharge in Electronics 3
    • VLSI and Analog Circuit Testing 4

C. Barillot

18 papers receiving 326 citations

Peers

C. Barillot
Comparison fields: 5 of 38
  • Hardware and Architecture 78
  • Electrical and Electronic Engineering 316
  • Radiation 44
  • Nuclear and High Energy Physics 43
  • Safety, Risk, Reliability and Quality 15
Replace B. Sagnes with:
B. Sagnes France
J. T. Blandford United States
Vasily S. Anashin Russia
J.B. Langworthy United States
M.-C. Calvet France
Alan D. Tipton United States
Anthony M. Phan United States
H.S. Kim United States
C. Chatry France
R. Marec France
C. Barillot relative to B. Sagnes France B. Sagnes's profile →
Citations per field
00.5×1.5×
B. Sagnes · 1×
Citations per year

Countries citing papers authored by C. Barillot

Since Specialization
Citations

This map shows the geographic impact of C. Barillot's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Barillot with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Barillot more than expected).

Fields of papers citing papers by C. Barillot

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Barillot. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Barillot. The network helps show where C. Barillot may publish in the future.

Co-authors

The 25 scholars most cited alongside C. Barillot, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C. Barillot Line = papers co-authored together C. Barillot links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 2000120
2 199699
3 199431
4 200224
5 200212
6 200812
7 199810
8 19967
9 20166
10 20056
11 20195
12 20134
13 20024
14
Updating the X-dose enhancement factor in recent technologies
20032
15 20132
16 20022
17 20201
18 19921
19 20020
20 20020

About C. Barillot

C. Barillot is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Radiation, Aerospace Engineering and Materials Chemistry, having authored 20 papers that have together received 348 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (16 papers), Semiconductor materials and devices (8 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), VLSI and Analog Circuit Testing (4 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Radiation Detection and Scintillator Technologies (3 papers), Electrostatic Discharge in Electronics (3 papers) and Radiation Shielding Materials Analysis (2 papers). The work is most often cited by research in Hardware and Architecture (78 citations), Electrical and Electronic Engineering (316 citations), Radiation (44 citations), Nuclear and High Energy Physics (43 citations) and Safety, Risk, Reliability and Quality (15 citations). C. Barillot has collaborated with scholars based in France, United States and Netherlands. Frequent co-authors include P. Calvel, R. Ecoffet, S. Duzellier, R. Marec, D. Falguère, C. Chatry, Philippe C. Adell, Hugh Barnaby, Ronald D. Schrimpf and E. G. Stassinopoulos. Their work appears in journals such as IEEE Transactions on Nuclear Science and Microelectronics Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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