Bruce Geil

31 papers and 349 indexed citations i.

About

Bruce Geil is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Mechanical Engineering. According to data from OpenAlex, Bruce Geil has authored 31 papers receiving a total of 349 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 5 papers in Atomic and Molecular Physics, and Optics and 5 papers in Mechanical Engineering. Recurrent topics in Bruce Geil’s work include Silicon Carbide Semiconductor Technologies (25 papers), Semiconductor materials and devices (13 papers) and Electromagnetic Compatibility and Noise Suppression (6 papers). Bruce Geil is often cited by papers focused on Silicon Carbide Semiconductor Technologies (25 papers), Semiconductor materials and devices (13 papers) and Electromagnetic Compatibility and Noise Suppression (6 papers). Bruce Geil collaborates with scholars based in United States, China and Germany. Bruce Geil's co-authors include Charles Scozzie, Anant Agarwal, Dimeji Ibitayo, Sei‐Hyung Ryu, Dionisios G. Vlachos, E. D. Wetzel, Aivars J. Lelis, Thomas Salem, Qingchun Zhang and Sarit Dhar and has published in prestigious journals such as IEEE Transactions on Power Electronics, Thin Solid Films and SAE technical papers on CD-ROM/SAE technical paper series.

In The Last Decade

Co-authorship network of co-authors of Bruce Geil i

Fields of papers citing papers by Bruce Geil

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Bruce Geil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bruce Geil. The network helps show where Bruce Geil may publish in the future.

Countries citing papers authored by Bruce Geil

Since Specialization
Citations

This map shows the geographic impact of Bruce Geil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bruce Geil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bruce Geil more than expected).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar’s output or impact.

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