Bruce Geil

619 citations
41 papers · 493 · h-index 14

Impact in

Papers in

    • Silicon Carbide Semiconductor Technologies 32
    • Semiconductor materials and devices 17
    • Electromagnetic Compatibility and Noise Suppression 7
    • Electrostatic Discharge in Electronics 5
    • Multilevel Inverters and Converters 4
    • Advancements in Semiconductor Devices and Circuit Design 4
    • Heat Transfer and Optimization 7

Bruce Geil

37 papers receiving 469 citations

Peers

Bruce Geil
Comparison fields: 5 of 37
  • Electrical and Electronic Engineering 360
  • Fluid Flow and Transfer Processes 28
  • Condensed Matter Physics 48
  • Mechanical Engineering 97
  • Computational Mechanics 46
Replace M. Miyazaki with:
M. Miyazaki Japan
Ruikang Wu China
Maniya Maleki Iran
S. Saadaoui Saudi Arabia
Zhiwei Hao China
Keunjoo Kim South Korea
Konstantin Etzold United States
Jeongmoo Huh South Korea
Philipp Rosner Germany
Elisha Rejovitzky Israel
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Citations per field
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M. Miyazaki · 1×
Citations per year

Countries citing papers authored by Bruce Geil

Since Specialization
Citations

This map shows the geographic impact of Bruce Geil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bruce Geil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bruce Geil more than expected).

Fields of papers citing papers by Bruce Geil

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Bruce Geil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bruce Geil. The network helps show where Bruce Geil may publish in the future.

Co-authors

The 25 scholars most cited alongside Bruce Geil, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Bruce Geil Line = papers co-authored together Bruce Geil links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 41 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200846
2 201040
3 200937
4 200835
5 200727
6 200727
7 200623
8 200722
9 200719
10 200817
11 200716
12 201116
13 200116
14 200215
15 200513
16 200613
17 200613
18 200012
19 200610
20 200710

About Bruce Geil

Bruce Geil is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering, Mechanics of Materials, Atomic and Molecular Physics, and Optics and Control and Systems Engineering, having authored 41 papers that have together received 493 indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (32 papers), Semiconductor materials and devices (17 papers), Heat Transfer and Optimization (7 papers), Electromagnetic Compatibility and Noise Suppression (7 papers), Electrostatic Discharge in Electronics (5 papers), Semiconductor materials and interfaces (4 papers), Multilevel Inverters and Converters (4 papers) and Advancements in Semiconductor Devices and Circuit Design (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (360 citations), Fluid Flow and Transfer Processes (28 citations), Condensed Matter Physics (48 citations), Mechanical Engineering (97 citations) and Computational Mechanics (46 citations). Bruce Geil has collaborated with scholars based in United States, China and Germany. Frequent co-authors include Charles Scozzie, Anant Agarwal, Dimeji Ibitayo, Sei‐Hyung Ryu, Thomas Salem, Aivars J. Lelis, John W. Palmour, Dionisios G. Vlachos, E. D. Wetzel and Nicholas R. Jankowski. Their work appears in journals such as Solid-State Electronics, SAE technical papers on CD-ROM/SAE technical paper series, Materials science forum, IEEE Transactions on Instrumentation and Measurement and Thin Solid Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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