B. Vrignon
Impact in
-
- Electromagnetic Compatibility and Noise Suppression
- Electrostatic Discharge in Electronics
- Electromagnetic Compatibility and Measurements
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Silicon Carbide Semiconductor Technologies
- Semiconductor materials and devices
- 3D IC and TSV technologies
Papers in
-
- Electromagnetic Compatibility and Noise Suppression 29
- Electrostatic Discharge in Electronics 27
- 3D IC and TSV technologies 9
- Integrated Circuits and Semiconductor Failure Analysis 9
- Electromagnetic Compatibility and Measurements 7
- Low-power high-performance VLSI design 5
- Silicon Carbide Semiconductor Technologies 4
- Semiconductor materials and devices 4
- Co-authors
- Sonia Ben Dhia (15 shared papers)Étienne Sicard (8 shared papers)Alexandre Boyer (14 shared papers)Junwu Tao (1 shared paper)L. Guillot (3 shared papers)Corentin Lemoine (3 shared papers)Jianfei Wu (2 shared papers)John A. Shepherd (7 shared papers)
In The Last Decade
B. Vrignon
37 papers receiving 322 citations
Peers
Comparison fields: 5 of 32
- Electrical and Electronic Engineering 318
- Hardware and Architecture 27
- Computer Graphics and Computer-Aided Design 5
- Safety, Risk, Reliability and Quality 7
- Medical Laboratory Technology 1
Countries citing papers authored by B. Vrignon
This map shows the geographic impact of B. Vrignon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Vrignon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Vrignon more than expected).
Fields of papers citing papers by B. Vrignon
This network shows the impact of papers produced by B. Vrignon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Vrignon. The network helps show where B. Vrignon may publish in the future.
Co-authors
The 25 scholars most cited alongside B. Vrignon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 38 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 65 | |
| 2 | 2014 | 38 | |
| 3 | 2005 | 37 | |
| 4 | 2011 | 29 | |
| 5 | 2009 | 26 | |
| 6 | 2012 | 15 | |
| 7 | Electromagnetic Near-Field Scanning for Microelectronic Test Chip Investigation | 2006 | 15 |
| 8 | 2005 | 9 | |
| 9 | 2015 | 9 | |
| 10 | 2010 | 9 | |
| 11 | 2017 | 8 | |
| 12 | 2011 | 7 | |
| 13 | 2012 | 6 | |
| 14 | 2012 | 5 | |
| 15 | 2011 | 5 | |
| 16 | 2014 | 5 | |
| 17 | 2011 | 5 | |
| 18 | 2014 | 4 | |
| 19 | 2015 | 4 | |
| 20 | 2013 | 4 |
About B. Vrignon
B. Vrignon is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Condensed Matter Physics, Computer Vision and Pattern Recognition and Control and Systems Engineering, having authored 38 papers that have together received 344 indexed citations. Recurring topics across this work include Electromagnetic Compatibility and Noise Suppression (29 papers), Electrostatic Discharge in Electronics (27 papers), 3D IC and TSV technologies (9 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Electromagnetic Compatibility and Measurements (7 papers), Low-power high-performance VLSI design (5 papers), Silicon Carbide Semiconductor Technologies (4 papers) and Semiconductor materials and devices (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (318 citations), Hardware and Architecture (27 citations), Computer Graphics and Computer-Aided Design (5 citations), Safety, Risk, Reliability and Quality (7 citations) and Medical Laboratory Technology (1 citation). B. Vrignon has collaborated with scholars based in France, China and Germany. Frequent co-authors include Sonia Ben Dhia, Étienne Sicard, Alexandre Boyer, Junwu Tao, L. Guillot, Corentin Lemoine, Jianfei Wu, John A. Shepherd, Alexandre Boyer and A. Boyer. Their work appears in journals such as IEEE Transactions on Electromagnetic Compatibility, Microelectronics Reliability, IEEE Transactions on Instrumentation and Measurement, IEICE Transactions on Electronics and Journal of Electronic Testing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.