B. Vrignon
Impact in
-
- Electromagnetic Compatibility and Noise Suppression
- Electrostatic Discharge in Electronics
- Electromagnetic Compatibility and Measurements
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- 3D IC and TSV technologies
- Silicon Carbide Semiconductor Technologies
- Semiconductor materials and devices
Papers in
-
- Electromagnetic Compatibility and Noise Suppression 25
- Electrostatic Discharge in Electronics 23
- 3D IC and TSV technologies 8
- Integrated Circuits and Semiconductor Failure Analysis 7
- Electromagnetic Compatibility and Measurements 6
- Silicon Carbide Semiconductor Technologies 4
- Low-power high-performance VLSI design 4
-
- VLSI and Analog Circuit Testing 3
- Co-authors
- Sonia Ben Dhia (13 shared papers)Étienne Sicard (8 shared papers)Alexandre Boyer (11 shared papers)Junwu Tao (1 shared paper)Jianfei Wu (2 shared papers)Jiancheng Li (1 shared paper)L. Guillot (3 shared papers)Alexandre Boyer (1 shared paper)
- Journals
- IEEE Transactions on Electromagnetic Compatibility (5 papers)IEEE Transactions on Instrumentation and Measurement (1 paper)IEICE Transactions on Electronics (1 paper)Microelectronics Reliability (1 paper)Journal of Electronic Testing (2 papers)
- Partner nations
- FranceChinaSwitzerland
In The Last Decade
B. Vrignon
30 papers receiving 268 citations
Peers
Comparison fields: 5 of 28
- Electrical and Electronic Engineering 266
- Hardware and Architecture 24
- Computer Graphics and Computer-Aided Design 5
- Safety, Risk, Reliability and Quality 7
- Medical Laboratory Technology 1
Countries citing papers authored by B. Vrignon
This map shows the geographic impact of B. Vrignon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Vrignon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Vrignon more than expected).
Fields of papers citing papers by B. Vrignon
This network shows the impact of papers produced by B. Vrignon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Vrignon. The network helps show where B. Vrignon may publish in the future.
Co-authors
The 25 scholars most cited alongside B. Vrignon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 33 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 63 | |
| 2 | 2014 | 36 | |
| 3 | 2005 | 34 | |
| 4 | 2011 | 24 | |
| 5 | 2009 | 23 | |
| 6 | Electromagnetic Near-Field Scanning for Microelectronic Test Chip Investigation | 2006 | 15 |
| 7 | 2012 | 12 | |
| 8 | 2010 | 8 | |
| 9 | 2005 | 8 | |
| 10 | 2017 | 7 | |
| 11 | 2012 | 6 | |
| 12 | 2011 | 5 | |
| 13 | 2013 | 4 | |
| 14 | 2015 | 4 | |
| 15 | 2011 | 4 | |
| 16 | 2012 | 3 | |
| 17 | 2009 | 3 | |
| 18 | 2008 | 3 | |
| 19 | 2009 | 3 | |
| 20 | 2011 | 3 |
About B. Vrignon
B. Vrignon is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Condensed Matter Physics, Control and Systems Engineering and Computer Vision and Pattern Recognition, having authored 33 papers that have together received 289 indexed citations. Recurring topics across this work include Electromagnetic Compatibility and Noise Suppression (25 papers), Electrostatic Discharge in Electronics (23 papers), 3D IC and TSV technologies (8 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Electromagnetic Compatibility and Measurements (6 papers), Silicon Carbide Semiconductor Technologies (4 papers), Low-power high-performance VLSI design (4 papers) and VLSI and Analog Circuit Testing (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (266 citations), Hardware and Architecture (24 citations), Computer Graphics and Computer-Aided Design (5 citations), Safety, Risk, Reliability and Quality (7 citations) and Medical Laboratory Technology (1 citation). B. Vrignon has collaborated with scholars based in France, China and Switzerland. Frequent co-authors include Sonia Ben Dhia, Étienne Sicard, Alexandre Boyer, Junwu Tao, Jianfei Wu, Jiancheng Li, L. Guillot, Alexandre Boyer, John Shepherd and C. Lemoine. Their work appears in journals such as IEEE Transactions on Electromagnetic Compatibility, IEEE Transactions on Instrumentation and Measurement, IEICE Transactions on Electronics, Microelectronics Reliability and Journal of Electronic Testing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.