B. Krist
Impact in
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- GaN-based semiconductor devices and materials
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- Copper Interconnects and Reliability
- Ga2O3 and related materials
Papers in
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- Semiconductor materials and devices 7
- Electronic Packaging and Soldering Technologies 3
- 3D IC and TSV technologies 1
- Integrated Circuits and Semiconductor Failure Analysis 1
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- Copper Interconnects and Reliability 6
- Co-authors
- Han Wui Then (1 shared paper)Kimin Jun (1 shared paper)P. Fischer (1 shared paper)Pratik Koirala (1 shared paper)N. Thomas (1 shared paper)Hui Jae Yoo (7 shared papers)M. Radosavljević (1 shared paper)Tushar K. Talukdar (1 shared paper)
- Journals
- IEEE Transactions on Electron Devices (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1 paper)
- Partner nations
- United States
In The Last Decade
B. Krist
7 papers receiving 121 citations
Peers
Comparison fields: 5 of 17
- Condensed Matter Physics 43
- Electronic, Optical and Magnetic Materials 50
- Surfaces, Coatings and Films 14
- Electrical and Electronic Engineering 108
- Hardware and Architecture 5
Countries citing papers authored by B. Krist
This map shows the geographic impact of B. Krist's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Krist with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Krist more than expected).
Fields of papers citing papers by B. Krist
This network shows the impact of papers produced by B. Krist. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Krist. The network helps show where B. Krist may publish in the future.
Co-authors
The 25 scholars most cited alongside B. Krist, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 47 | |
| 2 | 2016 | 21 | |
| 3 | 2014 | 14 | |
| 4 | 2012 | 14 | |
| 5 | 2010 | 13 | |
| 6 | 2013 | 12 | |
| 7 | 2015 | 3 | |
| 8 | 2014 | 0 |
About B. Krist
B. Krist is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Condensed Matter Physics and Mechanics of Materials, having authored 8 papers that have together received 124 indexed citations. Recurring topics across this work include Semiconductor materials and devices (7 papers), Copper Interconnects and Reliability (6 papers), Electronic Packaging and Soldering Technologies (3 papers), Semiconductor materials and interfaces (2 papers), Semiconductor Quantum Structures and Devices (1 paper), 3D IC and TSV technologies (1 paper), Metal and Thin Film Mechanics (1 paper) and Integrated Circuits and Semiconductor Failure Analysis (1 paper). The work is most often cited by research in Condensed Matter Physics (43 citations), Electronic, Optical and Magnetic Materials (50 citations), Surfaces, Coatings and Films (14 citations), Electrical and Electronic Engineering (108 citations) and Hardware and Architecture (5 citations). B. Krist has collaborated with scholars based in United States. Frequent co-authors include Han Wui Then, Kimin Jun, P. Fischer, Pratik Koirala, N. Thomas, Hui Jae Yoo, M. Radosavljević, Tushar K. Talukdar, Kanwal Jit Singh and J. S. Chawla. Their work appears in journals such as IEEE Transactions on Electron Devices and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.