Jeff Bielefeld

35 papers receiving 753 citations

Peers

Jeff Bielefeld
Comparison fields: 5 of 40
  • Electronic, Optical and Magnetic Materials 350
  • Ceramics and Composites 78
  • Electrical and Electronic Engineering 533
  • Materials Chemistry 321
  • Mechanics of Materials 164
Replace Jean‐François de Marneffe with:
Jean‐François de Marneffe Belgium
M.I. Alayo Brazil
G. B. Rayner United States
Takeshi Mitani Japan
R. Yakimova Sweden
Unnar B. Arnalds Iceland
K. Kubota Japan
S. Sathyamurthy United States
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V. D. Petrikov Russia
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Citations per field
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Citations per year

Countries citing papers authored by Jeff Bielefeld

Since Specialization
Citations

This map shows the geographic impact of Jeff Bielefeld's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeff Bielefeld with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeff Bielefeld more than expected).

Fields of papers citing papers by Jeff Bielefeld

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jeff Bielefeld. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeff Bielefeld. The network helps show where Jeff Bielefeld may publish in the future.

Co-authors

The 25 scholars most cited alongside Jeff Bielefeld, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Jeff Bielefeld Line = papers co-authored together Jeff Bielefeld links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 35 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201190
2 201375
3 201256
4 201150
5 201442
6 201138
7 201130
8 201530
9 199528
10 201325
11 201122
12 199522
13 201122
14 201521
15 201019
16 201418
17 201318
18 201418
19 200316
20 201316

About Jeff Bielefeld

Jeff Bielefeld is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry, Mechanics of Materials and Biomedical Engineering, having authored 35 papers that have together received 759 indexed citations. Recurring topics across this work include Semiconductor materials and devices (22 papers), Copper Interconnects and Reliability (19 papers), Thin-Film Transistor Technologies (8 papers), Metal and Thin Film Mechanics (6 papers), Advanced ceramic materials synthesis (6 papers), Advanced Surface Polishing Techniques (3 papers), Silicon Nanostructures and Photoluminescence (3 papers) and Thermal properties of materials (3 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (350 citations), Ceramics and Composites (78 citations), Electrical and Electronic Engineering (533 citations), Materials Chemistry (321 citations) and Mechanics of Materials (164 citations). Jeff Bielefeld has collaborated with scholars based in United States, United Kingdom and India. Frequent co-authors include Sean W. King, Marc French, W. A. Lanford, Reinhold H. Dauskardt, David Gidley, Dhanadeep Dutta, Canay Ege, Markus Kühn, Brian C. Daly and Donald Hondongwa. Their work appears in journals such as Journal of Non-Crystalline Solids, Applied Physics Letters, Journal of Applied Physics, Superlattices and Microstructures and Microelectronics Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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