Adrian Evans

542 citations
35 papers · 354 · h-index 10

Impact in

    • VLSI and Analog Circuit Testing
    • Embedded Systems Design Techniques
    • Radiation Effects in Electronics
    • Semiconductor materials and devices
    • Low-power high-performance VLSI design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Advancements in Semiconductor Devices and Circuit Design
    • Advanced Memory and Neural Computing

Papers in

    • Radiation Effects in Electronics 24
    • Semiconductor materials and devices 5
    • Low-power high-performance VLSI design 5
    • Integrated Circuits and Semiconductor Failure Analysis 4
    • VLSI and Analog Circuit Testing 17
    • Parallel Computing and Optimization Techniques 3

Adrian Evans

32 papers receiving 345 citations

Peers

Adrian Evans
Comparison fields: 5 of 29
  • Hardware and Architecture 208
  • Electrical and Electronic Engineering 314
  • Software 16
  • Safety, Risk, Reliability and Quality 25
  • Computer Networks and Communications 43
Replace Dan Alexandrescu with:
Dan Alexandrescu France
Jorge Tonfat Brazil
S. D’Angelo Italy
Tadanobu Toba Japan
R. Velazco France
A.J. KleinOsowski United States
Hortensia Mecha Spain
J. Ohlsson Sweden
Sarah Azimi Italy
Adrian Evans relative to Dan Alexandrescu France Dan Alexandrescu's profile →
Citations per field
00.5×1.5×
Dan Alexandrescu · 1×
Citations per year

Countries citing papers authored by Adrian Evans

Since Specialization
Citations

This map shows the geographic impact of Adrian Evans's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Adrian Evans with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Adrian Evans more than expected).

Fields of papers citing papers by Adrian Evans

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Adrian Evans. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Adrian Evans. The network helps show where Adrian Evans may publish in the future.

Co-authors

The 25 scholars most cited alongside Adrian Evans, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Adrian Evans Line = papers co-authored together Adrian Evans links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 35 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201649
2 201549
3 199833
4 201629
5 201426
6 201425
7 201621
8 201420
9 202215
10 20149
11 20159
12 20189
13 20179
14 20089
15 20167
16 20156
17 20156
18 20244
19 20242
20 20142

About Adrian Evans

Adrian Evans is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Computer Networks and Communications, Safety, Risk, Reliability and Quality and Artificial Intelligence, having authored 35 papers that have together received 354 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (24 papers), VLSI and Analog Circuit Testing (17 papers), Semiconductor materials and devices (5 papers), Low-power high-performance VLSI design (5 papers), Reliability and Maintenance Optimization (4 papers), Software Reliability and Analysis Research (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and Parallel Computing and Optimization Techniques (3 papers). The work is most often cited by research in Hardware and Architecture (208 citations), Electrical and Electronic Engineering (314 citations), Software (16 citations), Safety, Risk, Reliability and Quality (25 citations) and Computer Networks and Communications (43 citations). Adrian Evans has collaborated with scholars based in France, United States and Netherlands. Frequent co-authors include Dan Alexandrescu, Maximilien Glorieux, Mehdi B. Tahoori, Mojtaba Ebrahimi, Véronique Ferlet-Cavrois, Shi-Jie Wen, Pedro Reviriego, Juan Antonio Maestro, Li Chen and Vikas Chandra. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Transactions on Circuits & Systems II Express Briefs and IEEE Transactions on Device and Materials Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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