S. D’Angelo
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
- Embedded Systems Design Techniques
- Software top 10%
- Software Reliability and Analysis Research
Papers in
-
- Radiation Effects in Electronics 21
- Integrated Circuits and Semiconductor Failure Analysis 10
- CCD and CMOS Imaging Sensors 8
-
- VLSI and Analog Circuit Testing 13
- Embedded Systems Design Techniques 8
- Co-authors
- G.R. Sechi (29 shared papers)M. Alderighi (30 shared papers)Cecilia Metra (4 shared papers)Davide Salvi (4 shared papers)A. Paccagnella (2 shared papers)A. Candelori (2 shared papers)C. Poivey (2 shared papers)M. Citterio (2 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (4 papers)Journal of Electronic Testing (1 paper)Padua Research Archive (University of Padova) (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (3 papers)IET conference proceedings. (1 paper)
- Partner nations
- ItalyNetherlandsUnited Kingdom
In The Last Decade
S. D’Angelo
34 papers receiving 330 citations
Peers
Comparison fields: 5 of 32
- Hardware and Architecture 267
- Software 28
- Electrical and Electronic Engineering 316
- Safety, Risk, Reliability and Quality 26
- Computer Networks and Communications 39
Countries citing papers authored by S. D’Angelo
This map shows the geographic impact of S. D’Angelo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. D’Angelo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. D’Angelo more than expected).
Fields of papers citing papers by S. D’Angelo
This network shows the impact of papers produced by S. D’Angelo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. D’Angelo. The network helps show where S. D’Angelo may publish in the future.
Co-authors
The 25 scholars most cited alongside S. D’Angelo, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 40 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 82 | |
| 2 | 2004 | 42 | |
| 3 | 2002 | 27 | |
| 4 | 2004 | 26 | |
| 5 | 2003 | 21 | |
| 6 | 2010 | 21 | |
| 7 | 2003 | 16 | |
| 8 | 2002 | 14 | |
| 9 | 2005 | 11 | |
| 10 | 2008 | 11 | |
| 11 | 2005 | 9 | |
| 12 | 2008 | 7 | |
| 13 | 2002 | 6 | |
| 14 | 2008 | 6 | |
| 15 | 2009 | 6 | |
| 16 | 2009 | 5 | |
| 17 | 2020 | 4 | |
| 18 | 1997 | 4 | |
| 19 | 2002 | 4 | |
| 20 | 2002 | 4 |
About S. D’Angelo
S. D’Angelo is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Computer Networks and Communications, Aerospace Engineering and Instrumentation, having authored 40 papers that have together received 348 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (21 papers), VLSI and Analog Circuit Testing (13 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers), CCD and CMOS Imaging Sensors (8 papers), Embedded Systems Design Techniques (8 papers), Interconnection Networks and Systems (6 papers), Advanced Optical Sensing Technologies (4 papers) and Infrared Target Detection Methodologies (4 papers). The work is most often cited by research in Hardware and Architecture (267 citations), Software (28 citations), Electrical and Electronic Engineering (316 citations), Safety, Risk, Reliability and Quality (26 citations) and Computer Networks and Communications (39 citations). S. D’Angelo has collaborated with scholars based in Italy, Netherlands and United Kingdom. Frequent co-authors include G.R. Sechi, M. Alderighi, Cecilia Metra, Davide Salvi, A. Paccagnella, A. Candelori, C. Poivey, M. Citterio, Francesco d’Ovidio and M. Violante. Their work appears in journals such as IEEE Transactions on Nuclear Science, Journal of Electronic Testing, Padua Research Archive (University of Padova), Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and IET conference proceedings..
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.