A. Sieck

696 citations
38 papers · 490 · h-index 12

Impact in

Papers in

A. Sieck

36 papers receiving 455 citations

Peers

A. Sieck
Comparison fields: 5 of 47
  • Instrumentation 30
  • Atomic and Molecular Physics, and Optics 212
  • Electrical and Electronic Engineering 311
  • Materials Chemistry 213
  • Mechanics of Materials 57
Replace S. É. Putilin with:
S. É. Putilin Russia
Stephen W. Kennerly United States
I. D. Calder Canada
Patrick Martin France
Stefan Eggert Germany
A. Glozman Israel
D. N. Nikolaev Russia
Hiroyuki Uchida Japan
M. C. Debnath Japan
B. de Crémoux France
A. Sieck relative to S. É. Putilin Russia S. É. Putilin's profile →
Citations per field
00.5×
S. É. Putilin · 1×
Citations per year

Countries citing papers authored by A. Sieck

Since Specialization
Citations

This map shows the geographic impact of A. Sieck's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Sieck with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Sieck more than expected).

Fields of papers citing papers by A. Sieck

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Sieck. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Sieck. The network helps show where A. Sieck may publish in the future.

Co-authors

The 25 scholars most cited alongside A. Sieck, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with A. Sieck Line = papers co-authored together A. Sieck links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 38 papers — load more, or switch the sort, to bring in the rest.

#Work
1 199782
2 200372
3 200259
4 200140
5 201430
6 199925
7 199917
8 201614
9 199714
10 200014
11 199813
12 201811
13 20187
14 20037
15 20186
16 20186
17 20156
18 19976
19
Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies
20025
20 20165

About A. Sieck

A. Sieck is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry and Mechanics of Materials, having authored 38 papers that have together received 490 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (19 papers), Infrared Target Detection Methodologies (12 papers), Semiconductor materials and devices (9 papers), Advanced Optical Sensing Technologies (6 papers), Graphene research and applications (5 papers), Muon and positron interactions and applications (4 papers), Spectroscopy and Laser Applications (4 papers) and Calibration and Measurement Techniques (4 papers). The work is most often cited by research in Instrumentation (30 citations), Atomic and Molecular Physics, and Optics (212 citations), Electrical and Electronic Engineering (311 citations), Materials Chemistry (213 citations) and Mechanics of Materials (57 citations). A. Sieck has collaborated with scholars based in Germany, United States and Italy. Frequent co-authors include Thomas Frauenheim, Koblar Alan Jackson, M. Haugk, D. Porezag, Hartmut S. Leipner, Torsten E.M. Staab, Mark R. Pederson, Heinrich Figgemeier, M. J. Puska and J. Wendler. Their work appears in journals such as Physical review. B, Condensed matter, Applied Optics, Journal of Electronic Materials, Physica B Condensed Matter and Biological Cybernetics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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