D. Eich
Impact in
-
- Chalcogenide Semiconductor Thin Films
- Advanced Semiconductor Detectors and Materials
- Instrumentation top 10%
Papers in
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- Advanced Semiconductor Detectors and Materials 47
- Chalcogenide Semiconductor Thin Films 17
- CCD and CMOS Imaging Sensors 8
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- Infrared Target Detection Methodologies 30
- Calibration and Measurement Techniques 13
- Co-authors
- E. Umbach (14 shared papers)R. Fink (14 shared papers)Heinrich Figgemeier (38 shared papers)Stefan Hanna (30 shared papers)Ulf Winkler (3 shared papers)S. K. Kulkarni (2 shared papers)Clemens Heske (7 shared papers)J. Wendler (14 shared papers)
- Journals
- Journal of Electronic Materials (11 papers)Applied Physics Letters (3 papers)Physical review. B, Condensed matter (3 papers)Thin Solid Films (2 papers)Applied Optics (2 papers)
- Partner nations
- GermanyItalyUnited States
In The Last Decade
D. Eich
56 papers receiving 656 citations
Peers
Comparison fields: 5 of 42
- Electrical and Electronic Engineering 657
- Instrumentation 35
- Materials Chemistry 379
- Atomic and Molecular Physics, and Optics 237
- Aerospace Engineering 157
Countries citing papers authored by D. Eich
This map shows the geographic impact of D. Eich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Eich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Eich more than expected).
Fields of papers citing papers by D. Eich
This network shows the impact of papers produced by D. Eich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Eich. The network helps show where D. Eich may publish in the future.
Co-authors
The 25 scholars most cited alongside D. Eich, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 61 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 119 | |
| 2 | 1999 | 90 | |
| 3 | 2005 | 41 | |
| 4 | 2000 | 37 | |
| 5 | 1999 | 31 | |
| 6 | 1999 | 30 | |
| 7 | 2017 | 27 | |
| 8 | 2006 | 25 | |
| 9 | 1999 | 22 | |
| 10 | 2016 | 18 | |
| 11 | 2018 | 17 | |
| 12 | 2014 | 15 | |
| 13 | 2016 | 14 | |
| 14 | 2012 | 13 | |
| 15 | 1998 | 13 | |
| 16 | 2019 | 13 | |
| 17 | 2018 | 12 | |
| 18 | 2000 | 12 | |
| 19 | 2011 | 11 | |
| 20 | 2016 | 11 |
About D. Eich
D. Eich is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry and Instrumentation, having authored 61 papers that have together received 759 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (47 papers), Infrared Target Detection Methodologies (30 papers), Chalcogenide Semiconductor Thin Films (17 papers), Calibration and Measurement Techniques (13 papers), Semiconductor Quantum Structures and Devices (12 papers), Quantum Dots Synthesis And Properties (9 papers), CCD and CMOS Imaging Sensors (8 papers) and Spectroscopy and Laser Applications (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (657 citations), Instrumentation (35 citations), Materials Chemistry (379 citations), Atomic and Molecular Physics, and Optics (237 citations) and Aerospace Engineering (157 citations). D. Eich has collaborated with scholars based in Germany, Italy and United States. Frequent co-authors include E. Umbach, R. Fink, Heinrich Figgemeier, Stefan Hanna, Ulf Winkler, S. K. Kulkarni, Clemens Heske, J. Wendler, Rainer Breiter and Zhihao Chen. Their work appears in journals such as Journal of Electronic Materials, Applied Physics Letters, Physical review. B, Condensed matter, Thin Solid Films and Applied Optics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.