A. Kerlain
Impact in
- Instrumentation top 5%
- Advanced Optical Sensing Technologies
- Aerospace Engineering top 5%
- Infrared Target Detection Methodologies
- Calibration and Measurement Techniques
Papers in
-
- Advanced Semiconductor Detectors and Materials 42
- Chalcogenide Semiconductor Thin Films 8
- Silicon Carbide Semiconductor Technologies 5
-
- Infrared Target Detection Methodologies 21
- Calibration and Measurement Techniques 10
- Co-authors
- Laurent Rubaldo (28 shared papers)L. Mollard (12 shared papers)O. Gravrand (19 shared papers)V. Mosser (7 shared papers)V. Destefanis (11 shared papers)J. Rothman (9 shared papers)Nicolas Péré‐Laperne (18 shared papers)N. Baier (8 shared papers)
- Journals
- Journal of Electronic Materials (18 papers)Journal of Applied Physics (2 papers)Microelectronics Reliability (2 papers)Semiconductor Science and Technology (1 paper)Sensors and Actuators A Physical (1 paper)
- Partner nations
- FranceUnited StatesSpain
In The Last Decade
A. Kerlain
52 papers receiving 485 citations
Peers
Comparison fields: 5 of 35
- Instrumentation 79
- Aerospace Engineering 232
- Electrical and Electronic Engineering 477
- Atomic and Molecular Physics, and Optics 159
- Biophysics 16
Countries citing papers authored by A. Kerlain
This map shows the geographic impact of A. Kerlain's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Kerlain with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Kerlain more than expected).
Fields of papers citing papers by A. Kerlain
This network shows the impact of papers produced by A. Kerlain. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Kerlain. The network helps show where A. Kerlain may publish in the future.
Co-authors
The 25 scholars most cited alongside A. Kerlain, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 54 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 54 | |
| 2 | 2013 | 33 | |
| 3 | 2012 | 32 | |
| 4 | 2011 | 30 | |
| 5 | 2012 | 29 | |
| 6 | 2014 | 28 | |
| 7 | 2013 | 25 | |
| 8 | 2016 | 21 | |
| 9 | 2004 | 21 | |
| 10 | 2015 | 19 | |
| 11 | 2018 | 18 | |
| 12 | 2015 | 17 | |
| 13 | 2007 | 17 | |
| 14 | 2014 | 15 | |
| 15 | 2016 | 12 | |
| 16 | 2004 | 10 | |
| 17 | 2017 | 10 | |
| 18 | 2013 | 9 | |
| 19 | 2015 | 8 | |
| 20 | 2007 | 8 |
About A. Kerlain
A. Kerlain is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering, Atomic and Molecular Physics, and Optics, Instrumentation and Mechanics of Materials, having authored 54 papers that have together received 518 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (42 papers), Infrared Target Detection Methodologies (21 papers), Calibration and Measurement Techniques (10 papers), Semiconductor Quantum Structures and Devices (8 papers), Chalcogenide Semiconductor Thin Films (8 papers), Advanced Optical Sensing Technologies (8 papers), Silicon Carbide Semiconductor Technologies (5 papers) and Advanced X-ray and CT Imaging (4 papers). The work is most often cited by research in Instrumentation (79 citations), Aerospace Engineering (232 citations), Electrical and Electronic Engineering (477 citations), Atomic and Molecular Physics, and Optics (159 citations) and Biophysics (16 citations). A. Kerlain has collaborated with scholars based in France, United States and Spain. Frequent co-authors include Laurent Rubaldo, L. Mollard, O. Gravrand, V. Mosser, V. Destefanis, J. Rothman, Nicolas Péré‐Laperne, N. Baier, G. Destéfanis and C. Dua. Their work appears in journals such as Journal of Electronic Materials, Journal of Applied Physics, Microelectronics Reliability, Semiconductor Science and Technology and Sensors and Actuators A Physical.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.