O. Klin

1.0k citations
39 papers · 779 · h-index 18

Impact in

Papers in

O. Klin

37 papers receiving 658 citations

Peers

O. Klin
Comparison fields: 5 of 25
  • Instrumentation 63
  • Atomic and Molecular Physics, and Optics 544
  • Electrical and Electronic Engineering 738
  • Aerospace Engineering 189
  • Radiation 54
Replace A. M. Hoang with:
A. M. Hoang United States
Nutan Gautam United States
Edward Kwei-wei Huang United States
B. V. Olson United States
Wolfgang A. Cabanski Germany
N. Snapi Israel
Andrew Hood United States
A. Glozman Israel
Amy W. K. Liu United States
G. Bishop United States
O. Klin relative to A. M. Hoang United States A. M. Hoang's profile →
Citations per field
00.5×1.5×
A. M. Hoang · 1×
Citations per year

Countries citing papers authored by O. Klin

Since Specialization
Citations

This map shows the geographic impact of O. Klin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Klin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Klin more than expected).

Fields of papers citing papers by O. Klin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by O. Klin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Klin. The network helps show where O. Klin may publish in the future.

Co-authors

The 25 scholars most cited alongside O. Klin, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with O. Klin Line = papers co-authored together O. Klin links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 39 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201482
2 201269
3 201154
4 201644
5 201044
6 201343
7 201029
8 200728
9 201126
10 201724
11 201723
12 201222
13 200621
14 200620
15 201220
16 201119
17 201419
18 201817
19 201217
20 200914

About O. Klin

O. Klin is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Spectroscopy, Aerospace Engineering and Materials Chemistry, having authored 39 papers that have together received 779 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (36 papers), Semiconductor Quantum Structures and Devices (29 papers), Chalcogenide Semiconductor Thin Films (10 papers), Spectroscopy and Laser Applications (5 papers), Electronic and Structural Properties of Oxides (4 papers), Infrared Target Detection Methodologies (4 papers), Calibration and Measurement Techniques (4 papers) and Semiconductor materials and devices (4 papers). The work is most often cited by research in Instrumentation (63 citations), Atomic and Molecular Physics, and Optics (544 citations), Electrical and Electronic Engineering (738 citations), Aerospace Engineering (189 citations) and Radiation (54 citations). O. Klin has collaborated with scholars based in Israel and Russia. Frequent co-authors include Eliezer Weiss, N. Snapi, P. C. Klipstein, A. Glozman, Steven H. Grossman, I. Shtrichman, Inna Lukomsky, Michael Yassen, D. A. Aronov and Eyal Berkowicz. Their work appears in journals such as Journal of Electronic Materials, Applied Physics Letters, Journal of Applied Physics, Journal of Crystal Growth and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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