E. R. Blazejewski

30 papers receiving 450 citations

Peers

E. R. Blazejewski
Comparison fields: 5 of 36
  • Atomic and Molecular Physics, and Optics 306
  • Instrumentation 32
  • Electrical and Electronic Engineering 462
  • Spectroscopy 81
  • Aerospace Engineering 99
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G. M. Venzor United States
Y.-H. Zhang United States
E. P. G. Smith United States
C. Besikci Türkiye
E. R. Youngdale United States
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Eyal Berkowicz Israel
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Citations per year

Countries citing papers authored by E. R. Blazejewski

Since Specialization
Citations

This map shows the geographic impact of E. R. Blazejewski's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. R. Blazejewski with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. R. Blazejewski more than expected).

Fields of papers citing papers by E. R. Blazejewski

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. R. Blazejewski. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. R. Blazejewski. The network helps show where E. R. Blazejewski may publish in the future.

Co-authors

The 25 scholars most cited alongside E. R. Blazejewski, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with E. R. Blazejewski Line = papers co-authored together E. R. Blazejewski links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 31 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200782
2 200971
3 199257
4 200631
5 199227
6 200625
7 199023
8 198821
9 199819
10 200919
11 199318
12 199116
13 198513
14 199312
15 19929
16 20099
17 19878
18 19917
19 19917
20 20095

About E. R. Blazejewski

E. R. Blazejewski is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Spectroscopy, Aerospace Engineering and Mechanics of Materials, having authored 31 papers that have together received 498 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (26 papers), Semiconductor Quantum Structures and Devices (17 papers), Chalcogenide Semiconductor Thin Films (7 papers), Spectroscopy and Laser Applications (7 papers), Infrared Target Detection Methodologies (4 papers), Photonic and Optical Devices (3 papers), Calibration and Measurement Techniques (3 papers) and Thermography and Photoacoustic Techniques (3 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (306 citations), Instrumentation (32 citations), Electrical and Electronic Engineering (462 citations), Spectroscopy (81 citations) and Aerospace Engineering (99 citations). E. R. Blazejewski has collaborated with scholars based in United States, Canada and Germany. Frequent co-authors include Gail Williams, Jason M. Mumolo, Sam A. Keo, Cory J. Hill, Sir B. Rafol, David Z. Ting, Sarath D. Gunapala, Sumith V. Bandara, J. Bajaj and Yia‐Chung Chang. Their work appears in journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Physics Letters, Semiconductor Science and Technology, Journal of Electronic Materials and IEEE Transactions on Nuclear Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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