A. Inani
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Silicon Carbide Semiconductor Technologies
Papers in
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- Semiconductor materials and devices 6
- Integrated Circuits and Semiconductor Failure Analysis 6
- Advancements in Semiconductor Devices and Circuit Design 5
- Advancements in Photolithography Techniques 4
- Ferroelectric and Negative Capacitance Devices 3
- VLSI and FPGA Design Techniques 2
- Silicon and Solar Cell Technologies 1
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- VLSI and Analog Circuit Testing 4
- Co-authors
- V. Ramgopal Rao (5 shared papers)W. Greene (2 shared papers)Paul Vande Voorde (2 shared papers)J.C.S. Woo (2 shared papers)P. Zeitzoff (2 shared papers)J.M.C. Stork (1 shared paper)Baolei Cheng (1 shared paper)Min Cao (1 shared paper)
- Journals
- Japanese Journal of Applied Physics (1 paper)IEEE Transactions on Electron Devices (1 paper)Microelectronics Reliability (1 paper)DSpace (IIT Bombay) (2 papers)
- Partner nations
- United StatesIndiaSingapore
In The Last Decade
A. Inani
11 papers receiving 296 citations
Peers
Comparison fields: 5 of 18
- Electrical and Electronic Engineering 313
- Hardware and Architecture 12
- Atomic and Molecular Physics, and Optics 28
- Materials Chemistry 41
- Electronic, Optical and Magnetic Materials 15
Countries citing papers authored by A. Inani
This map shows the geographic impact of A. Inani's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Inani with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Inani more than expected).
Fields of papers citing papers by A. Inani
This network shows the impact of papers produced by A. Inani. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Inani. The network helps show where A. Inani may publish in the future.
Co-authors
The 20 scholars most cited alongside A. Inani, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 232 | |
| 2 | 1999 | 30 | |
| 3 | 1999 | 27 | |
| 4 | 2007 | 12 | |
| 5 | 2006 | 7 | |
| 6 | 2010 | 4 | |
| 7 | 1998 | 3 | |
| 8 | 2006 | 2 | |
| 9 | 2011 | 2 | |
| 10 | Capacitance Degradation due to Fringing Field in Deep Sub-Micron MOSFETs with High-K Gate Dielectrics | 1999 | 1 |
| 11 | 2006 | 1 |
About A. Inani
A. Inani is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Industrial and Manufacturing Engineering, Infectious Diseases and Organic Chemistry, having authored 11 papers that have together received 321 indexed citations. Recurring topics across this work include Semiconductor materials and devices (6 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Advancements in Photolithography Techniques (4 papers), VLSI and Analog Circuit Testing (4 papers), Ferroelectric and Negative Capacitance Devices (3 papers), VLSI and FPGA Design Techniques (2 papers) and Silicon and Solar Cell Technologies (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (313 citations), Hardware and Architecture (12 citations), Atomic and Molecular Physics, and Optics (28 citations), Materials Chemistry (41 citations) and Electronic, Optical and Magnetic Materials (15 citations). A. Inani has collaborated with scholars based in United States, India and Singapore. Frequent co-authors include V. Ramgopal Rao, W. Greene, Paul Vande Voorde, J.C.S. Woo, P. Zeitzoff, J.M.C. Stork, Baolei Cheng, Min Cao, Baohong Cheng and Jason C. S. Woo. Their work appears in journals such as Japanese Journal of Applied Physics, IEEE Transactions on Electron Devices, Microelectronics Reliability and DSpace (IIT Bombay).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.