B.E. Stine
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
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- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Advancements in Photolithography Techniques
- Semiconductor materials and devices
- VLSI and FPGA Design Techniques
- Advancements in Semiconductor Devices and Circuit Design
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 11
- Advancements in Photolithography Techniques 9
- Semiconductor materials and devices 6
- VLSI and FPGA Design Techniques 4
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- VLSI and Analog Circuit Testing 7
- Co-authors
- Duane S. Boning (15 shared papers)J.E. Chung (10 shared papers)Dennis O. Ouma (6 shared papers)Soo‐Young Oh (5 shared papers)O.S. Nakagawa (5 shared papers)Dale L. Hetherington (2 shared papers)Christopher P. Hess (4 shared papers)L.E. Camilletti (1 shared paper)
- Journals
- IEEE Transactions on Semiconductor Manufacturing (5 papers)Journal of The Electrochemical Society (1 paper)Microelectronic Engineering (1 paper)IEEE Transactions on Electron Devices (1 paper)Computer Standards & Interfaces (1 paper)
- Partner nations
- United StatesJapan
In The Last Decade
B.E. Stine
23 papers receiving 531 citations
Peers
Comparison fields: 5 of 31
- Hardware and Architecture 208
- Electrical and Electronic Engineering 474
- Industrial and Manufacturing Engineering 54
- Biomedical Engineering 161
- Statistics, Probability and Uncertainty 22
Countries citing papers authored by B.E. Stine
This map shows the geographic impact of B.E. Stine's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B.E. Stine with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B.E. Stine more than expected).
Fields of papers citing papers by B.E. Stine
This network shows the impact of papers produced by B.E. Stine. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B.E. Stine. The network helps show where B.E. Stine may publish in the future.
Co-authors
The 25 scholars most cited alongside B.E. Stine, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 23 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1997 | 172 | |
| 2 | 1998 | 112 | |
| 3 | 1998 | 90 | |
| 4 | 2003 | 20 | |
| 5 | 1996 | 19 | |
| 6 | 2002 | 19 | |
| 7 | EFFECT OF FINE-LINE DENSITY AND PITCH ON INTERCONNECT ILD THICKNESS VARIATION IN OXIDE CMP PROCESSES | 1997 | 18 |
| 8 | 1998 | 17 | |
| 9 | 2001 | 14 | |
| 10 | 2003 | 13 | |
| 11 | 2002 | 12 | |
| 12 | 1997 | 11 | |
| 13 | 2002 | 10 | |
| 14 | 2002 | 9 | |
| 15 | 2002 | 8 | |
| 16 | Comparison of Oxide Planarization Pattern Dependencies between Two Different CMP Tools Using Statistical Metrology | 1996 | 6 |
| 17 | 1997 | 5 | |
| 18 | 1998 | 3 | |
| 19 | 2002 | 3 | |
| 20 | 2002 | 2 |
About B.E. Stine
B.E. Stine is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Biomedical Engineering, Industrial and Manufacturing Engineering and Mechanical Engineering, having authored 23 papers that have together received 567 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (11 papers), Advancements in Photolithography Techniques (9 papers), Advanced Surface Polishing Techniques (7 papers), VLSI and Analog Circuit Testing (7 papers), Industrial Vision Systems and Defect Detection (6 papers), Semiconductor materials and devices (6 papers), VLSI and FPGA Design Techniques (4 papers) and Copper Interconnects and Reliability (4 papers). The work is most often cited by research in Hardware and Architecture (208 citations), Electrical and Electronic Engineering (474 citations), Industrial and Manufacturing Engineering (54 citations), Biomedical Engineering (161 citations) and Statistics, Probability and Uncertainty (22 citations). B.E. Stine has collaborated with scholars based in United States and Japan. Frequent co-authors include Duane S. Boning, J.E. Chung, Dennis O. Ouma, Soo‐Young Oh, O.S. Nakagawa, Dale L. Hetherington, Christopher P. Hess, L.E. Camilletti, M. Muthukrishnan and Michael R. Berman. Their work appears in journals such as IEEE Transactions on Semiconductor Manufacturing, Journal of The Electrochemical Society, Microelectronic Engineering, IEEE Transactions on Electron Devices and Computer Standards & Interfaces.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.