W. Huott
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
- Parallel Computing and Optimization Techniques
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- Low-power high-performance VLSI design
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- VLSI and FPGA Design Techniques
- Radiation Effects in Electronics
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 12
- Low-power high-performance VLSI design 11
- Semiconductor materials and devices 7
- Advancements in Semiconductor Devices and Circuit Design 3
- Radiation Effects in Electronics 2
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- VLSI and Analog Circuit Testing 14
- Co-authors
- Bryan Robbins (5 shared papers)R. Franch (5 shared papers)Y.H. Chan (10 shared papers)P.J. Restle (3 shared papers)N. James (3 shared papers)R. M. Dixon (2 shared papers)S. Weitzel (2 shared papers)Pramod Kumar Patel (5 shared papers)
- Journals
- IBM Journal of Research and Development (2 papers)IEEE Journal of Solid-State Circuits (1 paper)Microelectronics Reliability (1 paper)IEEE Design & Test of Computers (1 paper)
- Partner nations
- United StatesGermany
In The Last Decade
W. Huott
21 papers receiving 344 citations
Peers
Comparison fields: 5 of 23
- Hardware and Architecture 242
- Electrical and Electronic Engineering 338
- Computer Networks and Communications 22
- Control and Systems Engineering 20
- Software 3
Countries citing papers authored by W. Huott
This map shows the geographic impact of W. Huott's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Huott with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Huott more than expected).
Fields of papers citing papers by W. Huott
This network shows the impact of papers produced by W. Huott. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Huott. The network helps show where W. Huott may publish in the future.
Co-authors
The 25 scholars most cited alongside W. Huott, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 23 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 47 | |
| 2 | 2007 | 43 | |
| 3 | 2002 | 39 | |
| 4 | 2004 | 33 | |
| 5 | 1997 | 25 | |
| 6 | 2002 | 23 | |
| 7 | 1997 | 20 | |
| 8 | 2011 | 18 | |
| 9 | 2006 | 16 | |
| 10 | 2003 | 15 | |
| 11 | 2002 | 13 | |
| 12 | 2000 | 9 | |
| 13 | 2002 | 9 | |
| 14 | 2008 | 9 | |
| 15 | 2003 | 9 | |
| 16 | 2006 | 9 | |
| 17 | 1998 | 7 | |
| 18 | 2008 | 5 | |
| 19 | 2002 | 4 | |
| 20 | 2002 | 3 |
About W. Huott
W. Huott is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Biomedical Engineering, Control and Systems Engineering and Computer Networks and Communications, having authored 23 papers that have together received 357 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (14 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), Low-power high-performance VLSI design (11 papers), Semiconductor materials and devices (7 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Analog and Mixed-Signal Circuit Design (2 papers), Engineering and Test Systems (2 papers) and Radiation Effects in Electronics (2 papers). The work is most often cited by research in Hardware and Architecture (242 citations), Electrical and Electronic Engineering (338 citations), Computer Networks and Communications (22 citations), Control and Systems Engineering (20 citations) and Software (3 citations). W. Huott has collaborated with scholars based in United States and Germany. Frequent co-authors include Bryan Robbins, R. Franch, Y.H. Chan, P.J. Restle, N. James, R. M. Dixon, S. Weitzel, Pramod Kumar Patel, D. Plass and D.R. Knebel. Their work appears in journals such as IBM Journal of Research and Development, IEEE Journal of Solid-State Circuits, Microelectronics Reliability and IEEE Design & Test of Computers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.