V. Ku
Impact in
-
- Plasma Diagnostics and Applications
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Electrohydrodynamics and Fluid Dynamics
- Integrated Circuits and Semiconductor Failure Analysis
- Electrostatic Discharge in Electronics
-
- Dust and Plasma Wave Phenomena
Papers in
-
- Semiconductor materials and devices 5
- Plasma Diagnostics and Applications 4
- Advancements in Semiconductor Devices and Circuit Design 3
- Integrated Circuits and Semiconductor Failure Analysis 2
- Electrohydrodynamics and Fluid Dynamics 2
-
- Dust and Plasma Wave Phenomena 3
- Semiconductor materials and interfaces 1
- Co-authors
- J. E. Allen (3 shared papers)B. M. Annaratone (3 shared papers)Christopher Baiocco (1 shared paper)N. Rovedo (1 shared paper)Jia Chen (1 shared paper)Xiangdong Chen (1 shared paper)Padraic Shafer (1 shared paper)C. Wann (1 shared paper)
- Journals
- Journal of Applied Physics (3 papers)ECS Transactions (2 papers)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)
- Partner nations
- United StatesUnited KingdomGermany
In The Last Decade
V. Ku
8 papers receiving 174 citations
Peers
Comparison fields: 5 of 19
- Electrical and Electronic Engineering 186
- Atomic and Molecular Physics, and Optics 61
- Radiology, Nuclear Medicine and Imaging 24
- Mechanics of Materials 27
- Nuclear and High Energy Physics 10
Countries citing papers authored by V. Ku
This map shows the geographic impact of V. Ku's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Ku with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Ku more than expected).
Fields of papers citing papers by V. Ku
This network shows the impact of papers produced by V. Ku. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Ku. The network helps show where V. Ku may publish in the future.
Co-authors
The 25 scholars most cited alongside V. Ku, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 63 | |
| 2 | 1995 | 51 | |
| 3 | 1998 | 45 | |
| 4 | 1998 | 19 | |
| 5 | 1999 | 5 | |
| 6 | 2003 | 3 | |
| 7 | 2008 | 2 | |
| 8 | 2008 | 2 |
About V. Ku
V. Ku is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Aerospace Engineering and Biomedical Engineering, having authored 8 papers that have together received 190 indexed citations. Recurring topics across this work include Semiconductor materials and devices (5 papers), Plasma Diagnostics and Applications (4 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Dust and Plasma Wave Phenomena (3 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Electrohydrodynamics and Fluid Dynamics (2 papers), Copper Interconnects and Reliability (2 papers) and Semiconductor materials and interfaces (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (186 citations), Atomic and Molecular Physics, and Optics (61 citations), Radiology, Nuclear Medicine and Imaging (24 citations), Mechanics of Materials (27 citations) and Nuclear and High Energy Physics (10 citations). V. Ku has collaborated with scholars based in United States, United Kingdom and Germany. Frequent co-authors include J. E. Allen, B. M. Annaratone, Christopher Baiocco, N. Rovedo, Jia Chen, Xiangdong Chen, Padraic Shafer, C. Wann, E. Nowak and V. Chan. Their work appears in journals such as Journal of Applied Physics, ECS Transactions and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.