Steven Grantham
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
- Radiation top 10%
- X-ray Spectroscopy and Fluorescence Analysis
- Advanced X-ray Imaging Techniques
Papers in
-
- Advancements in Photolithography Techniques 23
- Integrated Circuits and Semiconductor Failure Analysis 7
-
- Electron and X-Ray Spectroscopy Techniques 19
- Co-authors
- C. Tarrio (27 shared papers)Brandon Lane (7 shared papers)Robert E. Vest (8 shared papers)Sergey Mekhontsev (5 shared papers)S. Bajt (5 shared papers)Eric M. Gullikson (4 shared papers)Jennifer Alameda (3 shared papers)Ivan Zhirnov (3 shared papers)
- Journals
- Journal of Applied Physics (6 papers)Review of Scientific Instruments (4 papers)Journal of Research of the National Institute of Standards and Technology (3 papers)Metrologia (2 papers)Measurement Science and Technology (1 paper)
- Partner nations
- United StatesEgyptCanada
In The Last Decade
Steven Grantham
49 papers receiving 468 citations
Peers
Comparison fields: 5 of 66
- Surfaces, Coatings and Films 121
- Radiation 87
- Structural Biology 14
- Automotive Engineering 94
- Mechanical Engineering 140
Countries citing papers authored by Steven Grantham
This map shows the geographic impact of Steven Grantham's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Steven Grantham with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Steven Grantham more than expected).
Fields of papers citing papers by Steven Grantham
This network shows the impact of papers produced by Steven Grantham. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Steven Grantham. The network helps show where Steven Grantham may publish in the future.
Co-authors
The 25 scholars most cited alongside Steven Grantham, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 50 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 69 | |
| 2 | 2020 | 54 | |
| 3 | 2022 | 40 | |
| 4 | Design, Developments, and Results from the NIST Additive Manufacturing Metrology Testbed (AMMT) | 2016 | 36 |
| 5 | 2003 | 32 | |
| 6 | 2003 | 17 | |
| 7 | 2014 | 16 | |
| 8 | 2003 | 13 | |
| 9 | 2016 | 12 | |
| 10 | 2002 | 12 | |
| 11 | 2007 | 12 | |
| 12 | 2019 | 12 | |
| 13 | 2004 | 11 | |
| 14 | 2006 | 10 | |
| 15 | 2021 | 10 | |
| 16 | 2010 | 10 | |
| 17 | 2008 | 9 | |
| 18 | 2011 | 9 | |
| 19 | 2011 | 8 | |
| 20 | 2001 | 7 |
About Steven Grantham
Steven Grantham is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Radiation, Mechanical Engineering and Biomedical Engineering, having authored 50 papers that have together received 495 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (23 papers), Electron and X-Ray Spectroscopy Techniques (19 papers), Advanced X-ray Imaging Techniques (9 papers), X-ray Spectroscopy and Fluorescence Analysis (8 papers), Calibration and Measurement Techniques (8 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Additive Manufacturing and 3D Printing Technologies (7 papers) and Welding Techniques and Residual Stresses (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (121 citations), Radiation (87 citations), Structural Biology (14 citations), Automotive Engineering (94 citations) and Mechanical Engineering (140 citations). Steven Grantham has collaborated with scholars based in United States, Egypt and Canada. Frequent co-authors include C. Tarrio, Brandon Lane, Robert E. Vest, Sergey Mekhontsev, S. Bajt, Eric M. Gullikson, Jennifer Alameda, Ivan Zhirnov, Henry N. Chapman and T. B. Lucatorto. Their work appears in journals such as Journal of Applied Physics, Review of Scientific Instruments, Journal of Research of the National Institute of Standards and Technology, Metrologia and Measurement Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.