M. Schürmann

About

M. Schürmann is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, M. Schürmann has authored 41 papers receiving a total of 392 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 14 papers in Surfaces, Coatings and Films and 13 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in M. Schürmann’s work include Semiconductor materials and devices (19 papers), Electron and X-Ray Spectroscopy Techniques (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). M. Schürmann is often cited by papers focused on Semiconductor materials and devices (19 papers), Electron and X-Ray Spectroscopy Techniques (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). M. Schürmann collaborates with scholars based in Germany, Brazil and United States. M. Schürmann's co-authors include C. Westphal, P. Kroll, W. Schweiger, H. Zacharias, P.A.M. Guichon, U. Berges, G. G. Kleiman, Abner de Siervo, Richard Landers and Marcelo Falsarella Carazzolle and has published in prestigious journals such as Physical Review Letters, Journal of Applied Physics and Physical Review B.

In The Last Decade

Co-authorship network of co-authors of M. Schürmann i

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Fields of papers citing papers by M. Schürmann

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Schürmann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Schürmann. The network helps show where M. Schürmann may publish in the future.

Countries citing papers authored by M. Schürmann

Since Specialization

Citations

This map shows the geographic impact of M. Schürmann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Schürmann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Schürmann more than expected).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar’s output or impact.

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