S.D. Millman
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
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- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Semiconductor materials and devices
- VLSI and FPGA Design Techniques
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 11
- Radiation Effects in Electronics 7
- Low-power high-performance VLSI design 3
- VLSI and FPGA Design Techniques 2
- 3D IC and TSV technologies 1
- Advancements in Photolithography Techniques 1
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- VLSI and Analog Circuit Testing 13
- Partner nations
- United States
In The Last Decade
S.D. Millman
13 papers receiving 343 citations
Peers
Comparison fields: 5 of 17
- Hardware and Architecture 356
- Electrical and Electronic Engineering 350
- Software 15
- Control and Systems Engineering 45
- Industrial and Manufacturing Engineering 15
Countries citing papers authored by S.D. Millman
This map shows the geographic impact of S.D. Millman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.D. Millman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.D. Millman more than expected).
Fields of papers citing papers by S.D. Millman
This network shows the impact of papers produced by S.D. Millman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.D. Millman. The network helps show where S.D. Millman may publish in the future.
Co-authors
The 2 scholars most cited alongside S.D. Millman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 118 | |
| 2 | 1992 | 70 | |
| 3 | 2002 | 63 | |
| 4 | 2003 | 28 | |
| 5 | 1994 | 22 | |
| 6 | 1989 | 18 | |
| 7 | 2005 | 17 | |
| 8 | 2002 | 12 | |
| 9 | 1994 | 8 | |
| 10 | 2002 | 4 | |
| 11 | 2002 | 3 | |
| 12 | 2002 | 2 | |
| 13 | 2002 | 1 | |
| 14 | 2002 | 1 |
About S.D. Millman
S.D. Millman is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Control and Systems Engineering, Information Systems and Infectious Diseases, having authored 14 papers that have together received 367 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (13 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Radiation Effects in Electronics (7 papers), Low-power high-performance VLSI design (3 papers), VLSI and FPGA Design Techniques (2 papers), 3D IC and TSV technologies (1 paper), Engineering and Test Systems (1 paper) and Advancements in Photolithography Techniques (1 paper). The work is most often cited by research in Hardware and Architecture (356 citations), Electrical and Electronic Engineering (350 citations), Software (15 citations), Control and Systems Engineering (45 citations) and Industrial and Manufacturing Engineering (15 citations). S.D. Millman has collaborated with scholars based in United States. Frequent co-authors include John M. Acken and E.J. McCluskey. Their work appears in journals such as IEEE Journal of Solid-State Circuits and Journal of Electronic Testing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.