P.G. Ryan
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 12
- Radiation Effects in Electronics 7
- Advancements in Photolithography Techniques 2
-
- VLSI and Analog Circuit Testing 11
- Co-authors
- W.K. Fuchs (7 shared papers)Irith Pomeranz (2 shared papers)Subhasish Mitra (1 shared paper)Kee Sup Kim (1 shared paper)Sumit Kumar Rawat (3 shared papers)M. Sonza Reorda (1 shared paper)Kevin Davis (1 shared paper)Xinli Gu (1 shared paper)
- Journals
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems (1 paper)Illinois Digital Environment for Access to Learning and Scholarship (University of Illinois at Urbana-Champaign) (1 paper)IEEE Design & Test of Computers (1 paper)International Conference on Computer Aided Design (1 paper)
- Partner nations
- United StatesItalyUnited Kingdom
In The Last Decade
P.G. Ryan
14 papers receiving 250 citations
Peers
Comparison fields: 5 of 17
- Hardware and Architecture 246
- Software 17
- Electrical and Electronic Engineering 242
- Control and Systems Engineering 35
- Industrial and Manufacturing Engineering 7
Countries citing papers authored by P.G. Ryan
This map shows the geographic impact of P.G. Ryan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P.G. Ryan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P.G. Ryan more than expected).
Fields of papers citing papers by P.G. Ryan
This network shows the impact of papers produced by P.G. Ryan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P.G. Ryan. The network helps show where P.G. Ryan may publish in the future.
Co-authors
The 11 scholars most cited alongside P.G. Ryan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 67 | |
| 2 | 1993 | 59 | |
| 3 | 2002 | 48 | |
| 4 | 2014 | 20 | |
| 5 | 2005 | 16 | |
| 6 | 1998 | 13 | |
| 7 | Compressed and Dynamic Fault Dictionaries for Fault Isolation | 1994 | 9 |
| 8 | 2002 | 7 | |
| 9 | 2002 | 6 | |
| 10 | 2014 | 5 | |
| 11 | 2002 | 4 | |
| 12 | 1992 | 3 | |
| 13 | 1992 | 3 | |
| 14 | 2005 | 2 | |
| 15 | 2002 | 0 |
About P.G. Ryan
P.G. Ryan is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Control and Systems Engineering, Computer Networks and Communications and Industrial and Manufacturing Engineering, having authored 15 papers that have together received 262 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (12 papers), VLSI and Analog Circuit Testing (11 papers), Radiation Effects in Electronics (7 papers), Engineering and Test Systems (2 papers), Industrial Vision Systems and Defect Detection (2 papers), Advancements in Photolithography Techniques (2 papers), Anomaly Detection Techniques and Applications (1 paper) and Image and Signal Denoising Methods (1 paper). The work is most often cited by research in Hardware and Architecture (246 citations), Software (17 citations), Electrical and Electronic Engineering (242 citations), Control and Systems Engineering (35 citations) and Industrial and Manufacturing Engineering (7 citations). P.G. Ryan has collaborated with scholars based in United States, Italy and United Kingdom. Frequent co-authors include W.K. Fuchs, Irith Pomeranz, Subhasish Mitra, Kee Sup Kim, Sumit Kumar Rawat, M. Sonza Reorda, Kevin Davis, Xinli Gu, Janusz Rajski and Jacob A. Abraham. Their work appears in journals such as IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Illinois Digital Environment for Access to Learning and Scholarship (University of Illinois at Urbana-Champaign), IEEE Design & Test of Computers and International Conference on Computer Aided Design.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.