S. Hofmann
Impact in
- Surfaces, Coatings and Films top 0.2%
- Electron and X-Ray Spectroscopy Techniques
- Metals and Alloys top 0.5%
Papers in
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- Ion-surface interactions and analysis 117
-
- Semiconductor materials and devices 73
- Integrated Circuits and Semiconductor Failure Analysis 56
- Co-authors
- Pavel Lejček (32 shared papers)J. M. Sanz (13 shared papers)A. Zalar (32 shared papers)Hermann Jehn (9 shared papers)J. Steffen (8 shared papers)J.B. Malherbe (3 shared papers)R. Kirchheim (6 shared papers)P. Armbruster (4 shared papers)
In The Last Decade
S. Hofmann
233 papers receiving 7.7k citations
Peers
Comparison fields: 5 of 101
- Surfaces, Coatings and Films 1.5k
- Metals and Alloys 546
- Computational Mechanics 2.6k
- Mechanics of Materials 2.3k
- Radiation 685
Countries citing papers authored by S. Hofmann
This map shows the geographic impact of S. Hofmann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Hofmann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Hofmann more than expected).
Fields of papers citing papers by S. Hofmann
This network shows the impact of papers produced by S. Hofmann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Hofmann. The network helps show where S. Hofmann may publish in the future.
Co-authors
The 25 scholars most cited alongside S. Hofmann, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 238 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1989 | 290 | |
| 2 | 1979 | 262 | |
| 3 | 1980 | 241 | |
| 4 | 1995 | 220 | |
| 5 | 1986 | 218 | |
| 6 | 2012 | 184 | |
| 7 | 1996 | 180 | |
| 8 | 1992 | 177 | |
| 9 | 1998 | 169 | |
| 10 | 1979 | 168 | |
| 11 | 1994 | 151 | |
| 12 | 1986 | 136 | |
| 13 | 1976 | 131 | |
| 14 | 1995 | 127 | |
| 15 | 1991 | 124 | |
| 16 | 1986 | 118 | |
| 17 | 1978 | 110 | |
| 18 | 2003 | 102 | |
| 19 | 1991 | 91 | |
| 20 | 1983 | 90 |
About S. Hofmann
S. Hofmann is a scholar working on Computational Mechanics, Electrical and Electronic Engineering, Materials Chemistry, Mechanics of Materials and Surfaces, Coatings and Films, having authored 238 papers that have together received 8.1k indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (117 papers), Semiconductor materials and devices (73 papers), Metal and Thin Film Mechanics (67 papers), Electron and X-Ray Spectroscopy Techniques (66 papers), Integrated Circuits and Semiconductor Failure Analysis (56 papers), Microstructure and mechanical properties (31 papers), Microstructure and Mechanical Properties of Steels (20 papers) and Nuclear Physics and Applications (18 papers). The work is most often cited by research in Surfaces, Coatings and Films (1.5k citations), Metals and Alloys (546 citations), Computational Mechanics (2.6k citations), Mechanics of Materials (2.3k citations) and Radiation (685 citations). S. Hofmann has collaborated with scholars based in Germany, Czechia and Slovenia. Frequent co-authors include Pavel Lejček, J. M. Sanz, A. Zalar, Hermann Jehn, J. Steffen, J.B. Malherbe, R. Kirchheim, P. Armbruster, W. Faust and H. Ewald. Their work appears in journals such as Surface and Interface Analysis, Thin Solid Films, Applied Surface Science, Vacuum and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.