S. Deneault

658 citations
12 papers · 567 · h-index 8

Impact in

Papers in

S. Deneault

12 papers receiving 542 citations

Peers

S. Deneault
Comparison fields: 5 of 46
  • Electrical and Electronic Engineering 349
  • Materials Chemistry 277
  • Surfaces, Coatings and Films 42
  • Atomic and Molecular Physics, and Optics 184
  • Electronic, Optical and Magnetic Materials 94
Replace C. H. Björkman with:
C. H. Björkman United States
Masaru Izawa Japan
Yoshinori Hayafuji Japan
G. Auvert France
F. Ferrieu France
Hiroyuki YAMAKAWA Japan
D. T. Amm Canada
A. Kaplan United Kingdom
J. Kouvetakis United States
D. A. Neumann United States
S. Deneault relative to C. H. Björkman United States C. H. Björkman's profile →
Citations per field
00.5×5.7×
C. H. Björkman · 1×
Citations per year

Countries citing papers authored by S. Deneault

Since Specialization
Citations

This map shows the geographic impact of S. Deneault's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Deneault with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Deneault more than expected).

Fields of papers citing papers by S. Deneault

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Deneault. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Deneault. The network helps show where S. Deneault may publish in the future.

Co-authors

The 25 scholars most cited alongside S. Deneault, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. Deneault Line = papers co-authored together S. Deneault links everyone, so they are left out of the graph.

All Works

12 of 12 papers shown
#Work
1 2003168
2 2007139
3 2004110
4 200657
5 200533
6 201819
7 200011
8 200511
9 20067
10 19995
11 20044
12 20063

About S. Deneault

S. Deneault is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics and Mechanics of Materials, having authored 12 papers that have together received 567 indexed citations. Recurring topics across this work include Nanofabrication and Lithography Techniques (4 papers), Advancements in Photolithography Techniques (4 papers), Diamond and Carbon-based Materials Research (3 papers), Photonic and Optical Devices (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Semiconductor materials and devices (2 papers), Silicon Nanostructures and Photoluminescence (1 paper) and Metal and Thin Film Mechanics (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (349 citations), Materials Chemistry (277 citations), Surfaces, Coatings and Films (42 citations), Atomic and Molecular Physics, and Optics (184 citations) and Electronic, Optical and Magnetic Materials (94 citations). S. Deneault has collaborated with scholars based in United States. Frequent co-authors include T. M. Lyszczarz, M. W. Geis, K. E. Krohn, Robert Wright, J. E. Butler, Matthew E. Grein, Junghyo Yoon, T. M. Bloomstein, S. J. Spector and Franz X. Käertner. Their work appears in journals such as Applied Physics Letters, Journal of Forensic Sciences, Semiconductor Science and Technology, Optics Express and IEEE Photonics Technology Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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