S. Deneault

658 citations
12 papers · 543 · h-index 8

Impact in

Papers in

S. Deneault

12 papers receiving 523 citations

Peers

S. Deneault
Comparison fields: 5 of 46
  • Materials Chemistry 271
  • Electrical and Electronic Engineering 334
  • Surfaces, Coatings and Films 40
  • Atomic and Molecular Physics, and Optics 171
  • Electronic, Optical and Magnetic Materials 91
Replace Masaru Izawa with:
Masaru Izawa Japan
K. Yokoo Japan
Yoshinori Hayafuji Japan
G. Auvert France
Shoichi Ono Japan
A. Kaplan United Kingdom
J.G. Langan United States
S. Roy India
Hiroyuki YAMAKAWA Japan
J. Kouvetakis United States
S. Deneault relative to Masaru Izawa Japan Masaru Izawa's profile →
Citations per field
00.5×
Masaru Izawa · 1×
Citations per year

Countries citing papers authored by S. Deneault

Since Specialization
Citations

This map shows the geographic impact of S. Deneault's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Deneault with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Deneault more than expected).

Fields of papers citing papers by S. Deneault

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Deneault. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Deneault. The network helps show where S. Deneault may publish in the future.

Co-authors

The 25 scholars most cited alongside S. Deneault, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. Deneault Line = papers co-authored together S. Deneault links everyone, so they are left out of the graph.

All Works

12 of 12 papers shown
#Work
1 2003164
2 2007130
3 2004109
4 200651
5 200533
6 201818
7 200010
8 200510
9 20067
10 20044
11 19994
12 20063

About S. Deneault

S. Deneault is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics and Mechanics of Materials, having authored 12 papers that have together received 543 indexed citations. Recurring topics across this work include Nanofabrication and Lithography Techniques (4 papers), Advancements in Photolithography Techniques (4 papers), Diamond and Carbon-based Materials Research (3 papers), Photonic and Optical Devices (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Semiconductor materials and devices (2 papers), Silicon Nanostructures and Photoluminescence (1 paper) and Metal and Thin Film Mechanics (1 paper). The work is most often cited by research in Materials Chemistry (271 citations), Electrical and Electronic Engineering (334 citations), Surfaces, Coatings and Films (40 citations), Atomic and Molecular Physics, and Optics (171 citations) and Electronic, Optical and Magnetic Materials (91 citations). S. Deneault has collaborated with scholars based in United States. Frequent co-authors include T. M. Lyszczarz, M. W. Geis, K. E. Krohn, Robert Wright, J. E. Butler, Junghyo Yoon, D. M. Lennon, S. J. Spector, Franz X. Käertner and R. T. Schulein. Their work appears in journals such as Applied Physics Letters, Semiconductor Science and Technology, Optics Express, Journal of Forensic Sciences and IEEE Photonics Technology Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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