C.L. Keast
Impact in
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- Semiconductor materials and devices
- 3D IC and TSV technologies
- Advancements in Semiconductor Devices and Circuit Design
- Advanced MEMS and NEMS Technologies
- Advanced Memory and Neural Computing
- CCD and CMOS Imaging Sensors
- Electronic Packaging and Soldering Technologies
- Materials Chemistry top 10%
- Graphene research and applications
Papers in
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- Semiconductor materials and devices 24
- 3D IC and TSV technologies 19
- Advancements in Semiconductor Devices and Circuit Design 19
- CCD and CMOS Imaging Sensors 12
- Thin-Film Transistor Technologies 11
- Integrated Circuits and Semiconductor Failure Analysis 11
- Advanced MEMS and NEMS Technologies 8
- Photonic and Optical Devices 8
- Co-authors
- Peter W. Wyatt (37 shared papers)Jakub T. Kedzierski (12 shared papers)Paul Healey (5 shared papers)James R. Burns (22 shared papers)Pei-Lan Hsu (4 shared papers)J.M. Knecht (27 shared papers)K. Warner (13 shared papers)D. Yost (24 shared papers)
- Journals
- IEEE Electron Device Letters (4 papers)IEEE Transactions on Electron Devices (4 papers)IEEE Microwave and Wireless Components Letters (3 papers)IEEE Transactions on Nuclear Science (3 papers)IEEE Journal of Solid-State Circuits (2 papers)
- Partner nations
- United StatesFranceIsrael
In The Last Decade
C.L. Keast
66 papers receiving 1.9k citations
Peers
Comparison fields: 5 of 53
- Electrical and Electronic Engineering 1.7k
- Materials Chemistry 574
- Instrumentation 41
- Biomedical Engineering 449
- Atomic and Molecular Physics, and Optics 312
Countries citing papers authored by C.L. Keast
This map shows the geographic impact of C.L. Keast's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.L. Keast with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.L. Keast more than expected).
Fields of papers citing papers by C.L. Keast
This network shows the impact of papers produced by C.L. Keast. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.L. Keast. The network helps show where C.L. Keast may publish in the future.
Co-authors
The 25 scholars most cited alongside C.L. Keast, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 68 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 356 | |
| 2 | 2006 | 212 | |
| 3 | 2002 | 123 | |
| 4 | 2010 | 109 | |
| 5 | 2001 | 96 | |
| 6 | 2005 | 92 | |
| 7 | 2009 | 92 | |
| 8 | 2009 | 90 | |
| 9 | 2010 | 78 | |
| 10 | 2004 | 78 | |
| 11 | 2000 | 55 | |
| 12 | 2006 | 50 | |
| 13 | 2008 | 34 | |
| 14 | 2003 | 33 | |
| 15 | 1992 | 30 | |
| 16 | 2002 | 26 | |
| 17 | 2004 | 26 | |
| 18 | 2009 | 25 | |
| 19 | 2002 | 23 | |
| 20 | 2003 | 22 |
About C.L. Keast
C.L. Keast is a scholar working on Electrical and Electronic Engineering, Media Technology, Biomedical Engineering, Atomic and Molecular Physics, and Optics and Automotive Engineering, having authored 68 papers that have together received 2.0k indexed citations. Recurring topics across this work include Semiconductor materials and devices (24 papers), 3D IC and TSV technologies (19 papers), Advancements in Semiconductor Devices and Circuit Design (19 papers), CCD and CMOS Imaging Sensors (12 papers), Thin-Film Transistor Technologies (11 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Advanced MEMS and NEMS Technologies (8 papers) and Photonic and Optical Devices (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.7k citations), Materials Chemistry (574 citations), Instrumentation (41 citations), Biomedical Engineering (449 citations) and Atomic and Molecular Physics, and Optics (312 citations). C.L. Keast has collaborated with scholars based in United States, France and Israel. Frequent co-authors include Peter W. Wyatt, Jakub T. Kedzierski, Paul Healey, James R. Burns, Pei-Lan Hsu, J.M. Knecht, K. Warner, D. Yost, Walt A. de Heer and Claire Berger. Their work appears in journals such as IEEE Electron Device Letters, IEEE Transactions on Electron Devices, IEEE Microwave and Wireless Components Letters, IEEE Transactions on Nuclear Science and IEEE Journal of Solid-State Circuits.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.