Rolf Lauer
Impact in
- Radiation top 10%
- Radioactive Decay and Measurement Techniques
- Advanced X-ray Imaging Techniques
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- Scientific Measurement and Uncertainty Evaluation
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 12
-
- Advanced Electron Microscopy Techniques and Applications 7
- Co-authors
- Peter C. Hinze (3 shared papers)Kirsten Ingolf Schiffmann (2 shared papers)Matthias Fryda (2 shared papers)Peter Becker (1 shared paper)Klaus Dorenwendt (1 shared paper)Guenter Goerigk (1 shared paper)Helmut Siegert (1 shared paper)Reinhard Probst (1 shared paper)
- Journals
- Ultramicroscopy (3 papers)Thin Solid Films (1 paper)Microelectronic Engineering (1 paper)Physical Review Letters (1 paper)IEEE Journal of Quantum Electronics (1 paper)
- Partner nations
- GermanyFranceUnited States
In The Last Decade
Rolf Lauer
13 papers receiving 401 citations
Peers
Comparison fields: 5 of 40
- Radiation 110
- Statistics, Probability and Uncertainty 64
- Structural Biology 10
- Surfaces, Coatings and Films 41
- Atomic and Molecular Physics, and Optics 156
Countries citing papers authored by Rolf Lauer
This map shows the geographic impact of Rolf Lauer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Rolf Lauer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Rolf Lauer more than expected).
Fields of papers citing papers by Rolf Lauer
This network shows the impact of papers produced by Rolf Lauer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Rolf Lauer. The network helps show where Rolf Lauer may publish in the future.
Co-authors
The 20 scholars most cited alongside Rolf Lauer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 21 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1981 | 166 | |
| 2 | 1999 | 104 | |
| 3 | 1996 | 69 | |
| 4 | 1992 | 48 | |
| 5 | 1996 | 15 | |
| 6 | 1999 | 8 | |
| 7 | 1985 | 7 | |
| 8 | 1967 | 6 | |
| 9 | 1968 | 4 | |
| 10 | 1969 | 2 | |
| 11 | 1973 | 1 | |
| 12 | 1974 | 1 | |
| 13 | 1975 | 1 | |
| 14 | 2020 | 1 | |
| 15 | Prospective trends in electron holography; influence of the noise on reconstructions of off-axis holograms and dynamical phase effects in perfect crystals | 1986 | 0 |
| 16 | 1969 | 0 | |
| 17 | 1990 | 0 | |
| 18 | 1976 | 0 | |
| 19 | 1998 | 0 | |
| 20 | 1990 | 0 |
About Rolf Lauer
Rolf Lauer is a scholar working on Surfaces, Coatings and Films, Structural Biology, Atomic and Molecular Physics, and Optics, Radiation and Biomedical Engineering, having authored 21 papers that have together received 433 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (12 papers), Advanced Electron Microscopy Techniques and Applications (7 papers), Force Microscopy Techniques and Applications (4 papers), Photocathodes and Microchannel Plates (3 papers), Advancements in Photolithography Techniques (3 papers), High voltage insulation and dielectric phenomena (2 papers), Advanced X-ray Imaging Techniques (2 papers) and Semiconductor Quantum Structures and Devices (2 papers). The work is most often cited by research in Radiation (110 citations), Statistics, Probability and Uncertainty (64 citations), Structural Biology (10 citations), Surfaces, Coatings and Films (41 citations) and Atomic and Molecular Physics, and Optics (156 citations). Rolf Lauer has collaborated with scholars based in Germany, France and United States. Frequent co-authors include Peter C. Hinze, Kirsten Ingolf Schiffmann, Matthias Fryda, Peter Becker, Klaus Dorenwendt, Guenter Goerigk, Helmut Siegert, Reinhard Probst, T. H. Metzger and Guillaume Vignaud. Their work appears in journals such as Ultramicroscopy, Thin Solid Films, Microelectronic Engineering, Physical Review Letters and IEEE Journal of Quantum Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.