Rolf Lauer
Impact in
- Radiation top 5%
- Radioactive Decay and Measurement Techniques
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- Scientific Measurement and Uncertainty Evaluation
Papers in
-
- Force Microscopy Techniques and Applications 5
- Semiconductor Quantum Structures and Devices 2
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- Diamond and Carbon-based Materials Research 2
- High voltage insulation and dielectric phenomena 2
- Co-authors
- P. Hinze (4 shared papers)M. Fryda (3 shared papers)K. Schiffmann (3 shared papers)G. Goerigk (3 shared papers)Peter Becker (1 shared paper)K. Dorenwendt (1 shared paper)H. Siegert (1 shared paper)R. Probst (1 shared paper)
- Journals
- Ultramicroscopy (3 papers)Microelectronic Engineering (1 paper)Physical review. B, Condensed matter (1 paper)IEEE Journal of Quantum Electronics (1 paper)Thin Solid Films (1 paper)
- Partner nations
- GermanyFranceUnited States
In The Last Decade
Rolf Lauer
10 papers receiving 369 citations
Peers
Comparison fields: 5 of 39
- Radiation 103
- Statistics, Probability and Uncertainty 60
- Structural Biology 10
- Atomic and Molecular Physics, and Optics 148
- Surfaces, Coatings and Films 29
Countries citing papers authored by Rolf Lauer
This map shows the geographic impact of Rolf Lauer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Rolf Lauer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Rolf Lauer more than expected).
Fields of papers citing papers by Rolf Lauer
This network shows the impact of papers produced by Rolf Lauer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Rolf Lauer. The network helps show where Rolf Lauer may publish in the future.
Co-authors
The 19 scholars most cited alongside Rolf Lauer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1981 | 152 | |
| 2 | 1999 | 97 | |
| 3 | 1996 | 63 | |
| 4 | 1992 | 48 | |
| 5 | 1996 | 14 | |
| 6 | 1999 | 6 | |
| 7 | 1985 | 6 | |
| 8 | 1967 | 6 | |
| 9 | 1997 | 3 | |
| 10 | 1968 | 2 | |
| 11 | 1998 | 0 |
About Rolf Lauer
Rolf Lauer is a scholar working on Atomic and Molecular Physics, and Optics, Materials Chemistry, Biomedical Engineering, Surfaces, Coatings and Films and Structural Biology, having authored 11 papers that have together received 397 indexed citations. Recurring topics across this work include Force Microscopy Techniques and Applications (5 papers), Electron and X-Ray Spectroscopy Techniques (3 papers), Semiconductor Quantum Structures and Devices (2 papers), Advanced Materials Characterization Techniques (2 papers), Diamond and Carbon-based Materials Research (2 papers), High voltage insulation and dielectric phenomena (2 papers), Advanced Electron Microscopy Techniques and Applications (2 papers) and Physics and Engineering Research Articles (1 paper). The work is most often cited by research in Radiation (103 citations), Statistics, Probability and Uncertainty (60 citations), Structural Biology (10 citations), Atomic and Molecular Physics, and Optics (148 citations) and Surfaces, Coatings and Films (29 citations). Rolf Lauer has collaborated with scholars based in Germany, France and United States. Frequent co-authors include P. Hinze, M. Fryda, K. Schiffmann, G. Goerigk, Peter Becker, K. Dorenwendt, H. Siegert, R. Probst, O. Schärpf and J. Peisl. Their work appears in journals such as Ultramicroscopy, Microelectronic Engineering, Physical review. B, Condensed matter, IEEE Journal of Quantum Electronics and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.