Peter Weis

22 papers receiving 644 citations

Peers

Peter Weis
Comparison fields: 5 of 72
  • Electronic, Optical and Magnetic Materials 215
  • Archeology 113
  • Analytical Chemistry 69
  • Electrical and Electronic Engineering 289
  • Biomedical Engineering 216
Replace D. Murra with:
D. Murra Italy
T. Miki Japan
Jean‐Michel Manceau France
Jiangfeng Zhu China
P. Turner Canada
M. N. Abedin United States
Nicholas Petraco United States
Xinbing Wang China
Jordana Blacksberg United States
Alain Duval France
Peter Weis relative to D. Murra Italy D. Murra's profile →
Citations per field
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Citations per year

Countries citing papers authored by Peter Weis

Since Specialization
Citations

This map shows the geographic impact of Peter Weis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Weis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Weis more than expected).

Fields of papers citing papers by Peter Weis

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Peter Weis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Weis. The network helps show where Peter Weis may publish in the future.

Co-authors

The 25 scholars most cited alongside Peter Weis, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Peter Weis Line = papers co-authored together Peter Weis links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 22 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2012219
2 200993
3 201158
4 201848
5 201138
6 200437
7 201434
8 195732
9 201821
10 202017
11 200915
12 202011
13 202110
14 201810
15 20219
16 20208
17 20227
18 20197
19
A new seed trap design
19972
20 20131

About Peter Weis

Peter Weis is a scholar working on Archeology, Mechanics of Materials, Analytical Chemistry, Biomedical Engineering and Safety Research, having authored 22 papers that have together received 679 indexed citations. Recurring topics across this work include Cultural Heritage Materials Analysis (10 papers), Analytical chemistry methods development (5 papers), Laser-induced spectroscopy and plasma (5 papers), Plasmonic and Surface Plasmon Research (4 papers), Metamaterials and Metasurfaces Applications (4 papers), Forensic Fingerprint Detection Methods (4 papers), Terahertz technology and applications (4 papers) and X-ray Spectroscopy and Fluorescence Analysis (3 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (215 citations), Archeology (113 citations), Analytical Chemistry (69 citations), Electrical and Electronic Engineering (289 citations) and Biomedical Engineering (216 citations). Peter Weis has collaborated with scholars based in Germany, United States and Spain. Frequent co-authors include Juan Luis García‐Pomar, Marco Rahm, A. Brodyanski, Benjamin Reinhard, R. Beigang, M. Rahm, Christian Imhof, Oliver Paul, Ruthmara Corzo and José R. Almirall. Their work appears in journals such as Forensic Chemistry, Journal of Analytical Atomic Spectrometry, Optics Express, Applied Physics Letters and Harvard Law Review.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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