Patrick William Leech

1.3k citations
122 papers · 1.1k · h-index 17

Impact in

Papers in

Patrick William Leech

117 papers receiving 1k citations

Peers

Patrick William Leech
Comparison fields: 5 of 58
  • Surfaces, Coatings and Films 60
  • Biomedical Engineering 256
  • Electrical and Electronic Engineering 368
  • Atomic and Molecular Physics, and Optics 191
  • Ceramics and Composites 34
Replace F. Ajustron with:
F. Ajustron France
Yijian Jiang China
John S. Ahearn United States
Bingjun Yu China
Daosheng S. Deng China
Vipin N. Tondare United States
Jan Mistrı́k Czechia
Mathias Rommel Germany
Aifei Pan China
I. Tobı́as Spain
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Citations per field
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Citations per year

Countries citing papers authored by Patrick William Leech

Since Specialization
Citations

This map shows the geographic impact of Patrick William Leech's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick William Leech with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick William Leech more than expected).

Fields of papers citing papers by Patrick William Leech

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick William Leech. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick William Leech. The network helps show where Patrick William Leech may publish in the future.

Co-authors

The 25 scholars most cited alongside Patrick William Leech, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Patrick William Leech Line = papers co-authored together Patrick William Leech links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 122 papers — load more, or switch the sort, to bring in the rest.

#Work
1 199962
2 200156
3 201256
4 200953
5 199652
6 200946
7 198537
8 200227
9 201324
10 199821
11 201021
12 199120
13 200919
14 200918
15 199617
16 200417
17 201117
18 201217
19 198916
20 199016

About Patrick William Leech

Patrick William Leech is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Biomedical Engineering, Computational Mechanics and Materials Chemistry, having authored 122 papers that have together received 1.1k indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (34 papers), Advanced Semiconductor Detectors and Materials (18 papers), Nanofabrication and Lithography Techniques (12 papers), Photonic and Optical Devices (10 papers), Silicon Carbide Semiconductor Technologies (10 papers), Plasma Diagnostics and Applications (8 papers), Advancements in Photolithography Techniques (8 papers) and Laser Material Processing Techniques (8 papers). The work is most often cited by research in Surfaces, Coatings and Films (60 citations), Biomedical Engineering (256 citations), Electrical and Electronic Engineering (368 citations), Atomic and Molecular Physics, and Optics (191 citations) and Ceramics and Composites (34 citations). Patrick William Leech has collaborated with scholars based in Australia, Germany and Malaysia. Frequent co-authors include Geoff K. Reeves, Anthony Stephen Holland, Yonggang Zhu, M. C. Ridgway, Nan Wu, Chuanpin Chen, Richard Manasseh, B.A. Sexton, Christopher D. Easton and P. C. Kemeny. Their work appears in journals such as Microelectronic Engineering, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of Applied Physics, Electronics Letters and Journal of Materials Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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