Patrick Thornton
Impact in
- Materials Chemistry top 5%
- Microstructure and mechanical properties
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 11
-
- Integrated Circuits and Semiconductor Failure Analysis 12
- Semiconductor materials and devices 3
- Semiconductor Lasers and Optical Devices 3
- Co-authors
- Toby Mitchell (5 shared papers)P. B. Hirsch (3 shared papers)N. W. Runham (2 shared papers)David C. Northrop (2 shared papers)R. Wayte (7 shared papers)Ladislaus Marton (1 shared paper)John O. Corliss (1 shared paper)
- Journals
- Solid-State Electronics (10 papers)Microelectronics Reliability (5 papers)Applied Physics Letters (3 papers)Journal of Applied Physics (3 papers)IEEE Transactions on Electron Devices (2 papers)
- Partner nations
- United KingdomUnited StatesCanada
In The Last Decade
Patrick Thornton
38 papers receiving 904 citations
Peers
Comparison fields: 5 of 70
- Materials Chemistry 507
- Surfaces, Coatings and Films 75
- General Materials Science 32
- Structural Biology 22
- Urology 51
Countries citing papers authored by Patrick Thornton
This map shows the geographic impact of Patrick Thornton's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick Thornton with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick Thornton more than expected).
Fields of papers citing papers by Patrick Thornton
This network shows the impact of papers produced by Patrick Thornton. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick Thornton. The network helps show where Patrick Thornton may publish in the future.
Co-authors
The 7 scholars most cited alongside Patrick Thornton, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 38 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1958 | 135 | |
| 2 | 1962 | 129 | |
| 3 | 1963 | 115 | |
| 4 | 1962 | 100 | |
| 5 | 1964 | 87 | |
| 6 | 1969 | 82 | |
| 7 | 1962 | 63 | |
| 8 | 1967 | 57 | |
| 9 | 1964 | 34 | |
| 10 | 1968 | 33 | |
| 11 | 1970 | 29 | |
| 12 | 1966 | 21 | |
| 13 | Scanning Electron Microscopy: Applications to Materials and Device Science | 1968 | 20 |
| 14 | 1966 | 17 | |
| 15 | 1966 | 14 | |
| 16 | 1968 | 13 | |
| 17 | 1969 | 12 | |
| 18 | 1967 | 10 | |
| 19 | 1979 | 10 | |
| 20 | 1963 | 8 |
About Patrick Thornton
Patrick Thornton is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry and Urology, having authored 38 papers that have together received 1.1k indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (12 papers), Semiconductor materials and interfaces (11 papers), Electron and X-Ray Spectroscopy Techniques (11 papers), Microstructure and mechanical properties (6 papers), Semiconductor materials and devices (3 papers), Semiconductor Lasers and Optical Devices (3 papers), Photocathodes and Microchannel Plates (3 papers) and Solidification and crystal growth phenomena (2 papers). The work is most often cited by research in Materials Chemistry (507 citations), Surfaces, Coatings and Films (75 citations), General Materials Science (32 citations), Structural Biology (22 citations) and Urology (51 citations). Patrick Thornton has collaborated with scholars based in United Kingdom, United States and Canada. Frequent co-authors include Toby Mitchell, P. B. Hirsch, N. W. Runham, David C. Northrop, R. Wayte, Ladislaus Marton and John O. Corliss. Their work appears in journals such as Solid-State Electronics, Microelectronics Reliability, Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.