Patrick Schiavone
Impact in
- Surfaces, Coatings and Films top 5%
- Optical Coatings and Gratings
- Electron and X-Ray Spectroscopy Techniques
- Biomedical Engineering top 5%
- 3D Printing in Biomedical Research
- Nanofabrication and Lithography Techniques
- Advanced Sensor and Energy Harvesting Materials
Papers in
-
- Advancements in Photolithography Techniques 50
- Integrated Circuits and Semiconductor Failure Analysis 21
-
- Optical Coatings and Gratings 22
- Electron and X-Ray Spectroscopy Techniques 22
- Co-authors
- D. Fuard (8 shared papers)Tzvetelina Tzvetkova‐Chevolleau (3 shared papers)Philippe Tracqui (2 shared papers)S. Decossas (1 shared paper)Jacques Ohayon (2 shared papers)Anastasis Stephanou (1 shared paper)Yohan Payan (4 shared papers)Emmanuel Promayon (3 shared papers)
- Journals
- Microelectronic Engineering (12 papers)Japanese Journal of Applied Physics (4 papers)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (2 papers)Electromagnetic waves (1 paper)Applied Physics Letters (1 paper)
- Partner nations
- FranceSwitzerlandUnited States
In The Last Decade
Patrick Schiavone
72 papers receiving 908 citations
Peers
Comparison fields: 5 of 92
- Surfaces, Coatings and Films 204
- Biomedical Engineering 582
- Cell Biology 151
- Electrical and Electronic Engineering 372
- Atomic and Molecular Physics, and Optics 118
Countries citing papers authored by Patrick Schiavone
This map shows the geographic impact of Patrick Schiavone's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick Schiavone with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick Schiavone more than expected).
Fields of papers citing papers by Patrick Schiavone
This network shows the impact of papers produced by Patrick Schiavone. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick Schiavone. The network helps show where Patrick Schiavone may publish in the future.
Co-authors
The 25 scholars most cited alongside Patrick Schiavone, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 79 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 356 | |
| 2 | 2008 | 149 | |
| 3 | 2009 | 63 | |
| 4 | 2004 | 62 | |
| 5 | 1997 | 19 | |
| 6 | 2010 | 17 | |
| 7 | 2002 | 17 | |
| 8 | 2005 | 13 | |
| 9 | 2005 | 13 | |
| 10 | 2004 | 13 | |
| 11 | 2003 | 13 | |
| 12 | 1995 | 13 | |
| 13 | 2010 | 12 | |
| 14 | 2010 | 11 | |
| 15 | 2008 | 11 | |
| 16 | 2009 | 9 | |
| 17 | 2003 | 9 | |
| 18 | 2006 | 7 | |
| 19 | 2009 | 7 | |
| 20 | 2008 | 6 |
About Patrick Schiavone
Patrick Schiavone is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Atomic and Molecular Physics, and Optics and Industrial and Manufacturing Engineering, having authored 79 papers that have together received 955 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (50 papers), Optical Coatings and Gratings (22 papers), Electron and X-Ray Spectroscopy Techniques (22 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers), Advanced Surface Polishing Techniques (10 papers), Industrial Vision Systems and Defect Detection (6 papers), Surface Roughness and Optical Measurements (6 papers) and Copper Interconnects and Reliability (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (204 citations), Biomedical Engineering (582 citations), Cell Biology (151 citations), Electrical and Electronic Engineering (372 citations) and Atomic and Molecular Physics, and Optics (118 citations). Patrick Schiavone has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include D. Fuard, Tzvetelina Tzvetkova‐Chevolleau, Philippe Tracqui, S. Decossas, Jacques Ohayon, Anastasis Stephanou, Yohan Payan, Emmanuel Promayon, C. Perret and C. Gourgon. Their work appears in journals such as Microelectronic Engineering, Japanese Journal of Applied Physics, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Electromagnetic waves and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.