Patrick F. Egan

32 papers receiving 570 citations

Peers

Patrick F. Egan
Comparison fields: 5 of 39
  • Statistics, Probability and Uncertainty 315
  • Spectroscopy 85
  • Atomic and Molecular Physics, and Optics 163
  • Mechanical Engineering 106
  • Aerospace Engineering 58
Replace Dong Meng with:
Dong Meng China
高波 Gao Bo China
Otto Jusko Germany
Youichi Bitou Japan
Yoon‐Soo Jang South Korea
Mark Bieler Germany
Xuejian Wu China
Alexandra B. Artusio‐Glimpse United States
Abdon E. Sepulveda United States
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Citations per field
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Dong Meng · 1×
Citations per year

Countries citing papers authored by Patrick F. Egan

Since Specialization
Citations

This map shows the geographic impact of Patrick F. Egan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick F. Egan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick F. Egan more than expected).

Fields of papers citing papers by Patrick F. Egan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick F. Egan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick F. Egan. The network helps show where Patrick F. Egan may publish in the future.

Co-authors

The 25 scholars most cited alongside Patrick F. Egan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Patrick F. Egan Line = papers co-authored together Patrick F. Egan links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 37 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201797
2 201573
3 201668
4 201266
5 201159
6 200653
7 201937
8 201731
9 201019
10 202312
11 200610
12 20136
13 20186
14 20226
15 20065
16 20065
17 20075
18 20054
19 20074
20 20144

About Patrick F. Egan

Patrick F. Egan is a scholar working on Statistics, Probability and Uncertainty, Aerospace Engineering, Computer Vision and Pattern Recognition, Mechanical Engineering and Spectroscopy, having authored 37 papers that have together received 590 indexed citations. Recurring topics across this work include Scientific Measurement and Uncertainty Evaluation (24 papers), Calibration and Measurement Techniques (9 papers), Advanced Measurement and Metrology Techniques (6 papers), Optical measurement and interference techniques (6 papers), Spectroscopy and Laser Applications (3 papers), Advanced Frequency and Time Standards (3 papers), Optical Coherence Tomography Applications (2 papers) and Glass properties and applications (1 paper). The work is most often cited by research in Statistics, Probability and Uncertainty (315 citations), Spectroscopy (85 citations), Atomic and Molecular Physics, and Optics (163 citations), Mechanical Engineering (106 citations) and Aerospace Engineering (58 citations). Patrick F. Egan has collaborated with scholars based in United States, Ireland and Italy. Frequent co-authors include Jack A. Stone, Jacob E. Ricker, Jay H. Hendricks, Gregory F. Strouse, Michael J. Connelly, Maurice Whelan, Julia K. Scherschligt, Gregory E. Scace, Allan H. Harvey and Yuanchao Yang. Their work appears in journals such as Optics Letters, Metrologia, IEEE Transactions on Instrumentation and Measurement, Optical Engineering and Precision Engineering.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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