Jacob E. Ricker
Impact in
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- Scientific Measurement and Uncertainty Evaluation
- Spectroscopy top 10%
- Spectroscopy and Laser Applications
Papers in
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- Scientific Measurement and Uncertainty Evaluation 18
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- Electron and X-Ray Spectroscopy Techniques 1
- Co-authors
- Jay H. Hendricks (17 shared papers)Patrick F. Egan (10 shared papers)Jack A. Stone (4 shared papers)Gregory F. Strouse (8 shared papers)Gregory E. Scace (5 shared papers)Stephen Eckel (3 shared papers)Daniel S. Barker (3 shared papers)James A. Fedchak (3 shared papers)
- Journals
- Metrologia (4 papers)Optics Letters (2 papers)Measurement (1 paper)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (1 paper)Thin Solid Films (1 paper)
- Partner nations
- United StatesGermanyJapan
In The Last Decade
Jacob E. Ricker
18 papers receiving 402 citations
Peers
Comparison fields: 5 of 33
- Statistics, Probability and Uncertainty 291
- Spectroscopy 53
- Atomic and Molecular Physics, and Optics 86
- Aerospace Engineering 43
- Surfaces, Coatings and Films 10
Countries citing papers authored by Jacob E. Ricker
This map shows the geographic impact of Jacob E. Ricker's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jacob E. Ricker with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jacob E. Ricker more than expected).
Fields of papers citing papers by Jacob E. Ricker
This network shows the impact of papers produced by Jacob E. Ricker. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jacob E. Ricker. The network helps show where Jacob E. Ricker may publish in the future.
Co-authors
The 24 scholars most cited alongside Jacob E. Ricker, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 97 | |
| 2 | 2015 | 73 | |
| 3 | 2016 | 68 | |
| 4 | 2018 | 33 | |
| 5 | 2017 | 31 | |
| 6 | 2018 | 29 | |
| 7 | 2016 | 22 | |
| 8 | 2016 | 16 | |
| 9 | 2021 | 10 | |
| 10 | 2013 | 6 | |
| 11 | 2018 | 5 | |
| 12 | 2021 | 5 | |
| 13 | 2014 | 4 | |
| 14 | 2018 | 4 | |
| 15 | MEASURING PRESSURE AND VACUUM WITH LIGHT: A NEW PHOTONIC, QUANTUM-BASED, PRESSURE STANDARD | NIST | 2015 | 3 |
| 16 | 2016 | 3 | |
| 17 | In Search of Better Pressure Standards | NIST | 2014 | 1 |
| 18 | 2018 | 1 | |
| 19 | 2025 | 0 |
About Jacob E. Ricker
Jacob E. Ricker is a scholar working on Statistics, Probability and Uncertainty, Surfaces, Coatings and Films, Mechanical Engineering, Computer Vision and Pattern Recognition and Aerospace Engineering, having authored 19 papers that have together received 411 indexed citations. Recurring topics across this work include Scientific Measurement and Uncertainty Evaluation (18 papers), Advanced Measurement and Metrology Techniques (2 papers), Calibration and Measurement Techniques (1 paper), Advanced Materials and Semiconductor Technologies (1 paper), Electron and X-Ray Spectroscopy Techniques (1 paper), Surface and Thin Film Phenomena (1 paper) and Optical measurement and interference techniques (1 paper). The work is most often cited by research in Statistics, Probability and Uncertainty (291 citations), Spectroscopy (53 citations), Atomic and Molecular Physics, and Optics (86 citations), Aerospace Engineering (43 citations) and Surfaces, Coatings and Films (10 citations). Jacob E. Ricker has collaborated with scholars based in United States, Germany and Japan. Frequent co-authors include Jay H. Hendricks, Patrick F. Egan, Jack A. Stone, Gregory F. Strouse, Gregory E. Scace, Stephen Eckel, Daniel S. Barker, James A. Fedchak, Julia K. Scherschligt and Douglas A. Olson. Their work appears in journals such as Metrologia, Optics Letters, Measurement, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.