O. Samman
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Embedded Systems Design Techniques
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- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and FPGA Design Techniques
- Radiation Effects in Electronics
- 3D IC and TSV technologies
Papers in
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- Integrated Circuits and Semiconductor Failure Analysis 4
- VLSI and FPGA Design Techniques 4
- graph theory and CDMA systems 1
- Semiconductor materials and devices 1
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- VLSI and Analog Circuit Testing 7
- Embedded Systems Design Techniques 1
- Co-authors
- Wu-Tung Cheng (8 shared papers)Chien-Chung Tsai (7 shared papers)Nilanjan Mukherjee (7 shared papers)Yu Huang (6 shared papers)S.M. Reddy (6 shared papers)Patrick Reuter (1 shared paper)Sz‐Nian Lai (1 shared paper)Yu Huang (1 shared paper)
- Partner nations
- United StatesHungary
In The Last Decade
O. Samman
8 papers receiving 334 citations
Peers
Comparison fields: 5 of 12
- Hardware and Architecture 341
- Electrical and Electronic Engineering 315
- Computer Networks and Communications 54
- Control and Systems Engineering 45
- Software 3
Countries citing papers authored by O. Samman
This map shows the geographic impact of O. Samman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Samman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Samman more than expected).
Fields of papers citing papers by O. Samman
This network shows the impact of papers produced by O. Samman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Samman. The network helps show where O. Samman may publish in the future.
Co-authors
The 11 scholars most cited alongside O. Samman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 134 | |
| 2 | 2002 | 117 | |
| 3 | 2004 | 25 | |
| 4 | 2002 | 24 | |
| 5 | 2002 | 19 | |
| 6 | 2003 | 11 | |
| 7 | 2002 | 8 | |
| 8 | 2002 | 8 |
About O. Samman
O. Samman is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Industrial and Manufacturing Engineering, Computer Networks and Communications and Control and Systems Engineering, having authored 8 papers that have together received 346 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (7 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), VLSI and FPGA Design Techniques (4 papers), Manufacturing Process and Optimization (2 papers), Engineering and Test Systems (1 paper), Embedded Systems Design Techniques (1 paper), graph theory and CDMA systems (1 paper) and Semiconductor materials and devices (1 paper). The work is most often cited by research in Hardware and Architecture (341 citations), Electrical and Electronic Engineering (315 citations), Computer Networks and Communications (54 citations), Control and Systems Engineering (45 citations) and Software (3 citations). O. Samman has collaborated with scholars based in United States and Hungary. Frequent co-authors include Wu-Tung Cheng, Chien-Chung Tsai, Nilanjan Mukherjee, Yu Huang, S.M. Reddy, Patrick Reuter, Sz‐Nian Lai, Yu Huang, Sundara Reddy and Krishnendu Chakrabarty. Their work appears in journals such as Journal of Electronic Testing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.