Nilanjan Mukherjee
About
Nilanjan Mukherjee has authored 73 papers that have received a total of 870 indexed citations.
This includes 51 papers in Electrical and Electronic Engineering, 37 papers in Hardware and Architecture and 23 papers in Control and Systems Engineering. The topics of these papers are VLSI and Analog Circuit Testing (36 papers), Integrated Circuits and Semiconductor Failure Analysis (34 papers) and Microgrid Control and Optimization (12 papers). Nilanjan Mukherjee is often cited by papers focused on VLSI and Analog Circuit Testing (36 papers), Integrated Circuits and Semiconductor Failure Analysis (34 papers) and Microgrid Control and Optimization (12 papers) and collaborates with scholars based in United States, Poland and United Kingdom. Nilanjan Mukherjee's co-authors include Janusz Rajski, Jerzy Tyszer, Dani Strickland, Grzegorz Mrugalski and S.M. Reddy and has published in prestigious journals such as IEEE Transactions on Industrial Electronics, IEEE Communications Magazine and Composite Structures.
In The Last Decade
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